Satoshi SASAKI

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection device
- Patent number 8,638,118
- Issue date Jan 28, 2014
- Panasonic Corporation
- Yoshirou Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection device and semiconductor wafer inspection method u...
- Patent number 8,400,182
- Issue date Mar 19, 2013
- Panasonic Corporation
- Yoshirou Nakata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION DEVICE
- Publication number 20130147504
- Publication date Jun 13, 2013
- PANASONIC CORPORATION
- Yoshirou NAKATA
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION DEVICE AND SEMICONDUCTOR WAFER INSPECTION METHOD U...
- Publication number 20110095780
- Publication date Apr 28, 2011
- Yoshirou NAKATA
- G01 - MEASURING TESTING
Information Patent Application
DATA REPRODUCTION METHOD AND DATA REPRODUCTION APPARATUS
- Publication number 20110077938
- Publication date Mar 31, 2011
- PANASONIC CORPORATION
- Atsutoshi Naraki
- G10 - MUSICAL INSTRUMENTS ACOUSTICS