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Satoshi Suzuki
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Miho Inashiki Ibaraki-Prefecture, JP
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last 30 patents
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Patent Grant
Method for quantifying over-etch of a conductive feature
Patent number
7,419,609
Issue date
Sep 2, 2008
Texas Instruments Incorporated
Raba Mezenner
B81 - MICRO-STRUCTURAL TECHNOLOGY
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last 30 patents
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Patent Application
METHOD FOR QUANTIFYING OVER-ETCH OF A CONDUCTIVE FEATURE
Publication number
20080113087
Publication date
May 15, 2008
TEXAS INSTRUMENTS INCORPORATED
Rabah Mezenner
B81 - MICRO-STRUCTURAL TECHNOLOGY