Satoshi Takada

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Battery device including battery cell group configured by a plurali...
- Patent number 11,735,785
- Issue date Aug 22, 2023
- Honda Motor Co., Ltd.
- Kyosuke Miyoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,557,457
- Issue date Jan 17, 2023
- HITACHI HIGH-TECH CORPORATION
- Kosuke Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vehicle battery device
- Patent number 11,552,361
- Issue date Jan 10, 2023
- Honda Motor Co., Ltd.
- Hideaki Sakai
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Charged particle beam device
- Patent number 11,328,897
- Issue date May 10, 2022
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vehicle battery device
- Patent number 11,108,096
- Issue date Aug 31, 2021
- Honda Motor Co., Ltd.
- Kyosuke Miyoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vehicle battery device
- Patent number 11,069,928
- Issue date Jul 20, 2021
- Honda Motor Co., Ltd.
- Kyosuke Miyoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 10,269,536
- Issue date Apr 23, 2019
- Hitachi High-Technologies Corporation
- Satoshi Takada
- G01 - MEASURING TESTING
Information Patent Grant
Continuous image capturing based on detection of a specific state
- Patent number 10,218,910
- Issue date Feb 26, 2019
- Sony Corporation
- Akira Hirai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for pattern measurement, method for setting device parameter...
- Patent number 9,831,062
- Issue date Nov 28, 2017
- Hitachi High-Technologies Corporation
- Makoto Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, method, and program for controlling display for continuo...
- Patent number 8,934,041
- Issue date Jan 13, 2015
- Sony Corporation
- Akira Hirai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,822,920
- Issue date Sep 2, 2014
- Hitachi High-Technologies Corporation
- Tatsuichi Katou
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus, method of controlling imaging apparatus, and pro...
- Patent number 8,675,110
- Issue date Mar 18, 2014
- Sony Corporation
- Akira Hirai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,847,249
- Issue date Dec 7, 2010
- Hitachi High-Technologies Corporation
- Noritsugu Takahashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGING DEVICE, IMAGING CONTROL METHOD, AND PROGRAM
- Publication number 20240314422
- Publication date Sep 19, 2024
- SONY GROUP CORPORATION
- FUMINORI NOHARA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240151665
- Publication date May 9, 2024
- Hitachi High-Tech Corporation
- Yohei NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Defect Classification Device and Defect Classification Program
- Publication number 20240127421
- Publication date Apr 18, 2024
- Hitachi High-Tech Corporation
- Yohei MINEKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection System and Non-Transitory Computer-Readable Medium
- Publication number 20240127417
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Takehiro HIRAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection System
- Publication number 20240029994
- Publication date Jan 25, 2024
- Hitachi High-Tech Corporation
- Natsuki TSUNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20230369012
- Publication date Nov 16, 2023
- Hitachi High-Tech Corporation
- Naoko TAKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection Method
- Publication number 20230273254
- Publication date Aug 31, 2023
- Hitachi High-Tech Corporation
- Shota MITSUGI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE AND METHOD FOR INSPECTING SEMICONDU...
- Publication number 20230273253
- Publication date Aug 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro SHIRASAKI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20230253180
- Publication date Aug 10, 2023
- HITACHI HIGH-TECH CORPORATION
- Daisuke BIZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BATTERY PACK
- Publication number 20230238656
- Publication date Jul 27, 2023
- Honda Motor Co., Ltd.
- Satoshi TAKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BATTERY PACK AND CELL ASSEMBLY
- Publication number 20230238661
- Publication date Jul 27, 2023
- Honda Motor Co., Ltd.
- Satoshi TAKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Computer System of Observation Device and Processing Method
- Publication number 20220187810
- Publication date Jun 16, 2022
- HITACHI HIGH-TECH CORPORATION
- Kosuke MATSUMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
END PLATE SECURING STRUCTURE AND BATTERY DEVICE
- Publication number 20220140430
- Publication date May 5, 2022
- Honda Motor Co., Ltd.
- Ryu TATE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20220028652
- Publication date Jan 27, 2022
- HITACHI HIGH-TECH CORPORATION
- Kosuke MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BATTERY DEVICE AND METHOD FOR MANUFACTURING BATTERY DEVICE
- Publication number 20210265681
- Publication date Aug 26, 2021
- Honda Motor Co., Ltd.
- Kyosuke MIYOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BATTERY DEVICE AND METHOD FOR MANUFACTURING BATTERY DEVICE
- Publication number 20210234211
- Publication date Jul 29, 2021
- Honda Motor Co., Ltd.
- Kyosuke MIYOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20210066029
- Publication date Mar 4, 2021
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- G01 - MEASURING TESTING
Information Patent Application
VEHICLE BATTERY DEVICE
- Publication number 20200057459
- Publication date Feb 20, 2020
- Honda Motor Co.,Ltd.
- Kyosuke MIYOSHI
- G05 - CONTROLLING REGULATING
Information Patent Application
VEHICLE BATTERY DEVICE
- Publication number 20200058964
- Publication date Feb 20, 2020
- Honda Motor Co.,Ltd.
- Kyosuke MIYOSHI
- G05 - CONTROLLING REGULATING
Information Patent Application
VEHICLE BATTERY DEVICE
- Publication number 20200058909
- Publication date Feb 20, 2020
- Honda Motor Co.,Ltd.
- Hideaki SAKAI
- B60 - VEHICLES IN GENERAL
Information Patent Application
Electron Microscope
- Publication number 20180240643
- Publication date Aug 23, 2018
- Hitachi High-Technologies Corporation
- Satoshi TAKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Pattern Measurement, Method for Setting Device Parameter...
- Publication number 20150357158
- Publication date Dec 10, 2015
- Hitachi High-Technologies Corporation
- Makoto SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING APPARATUS, METHOD OF CONTROLLING IMAGING APPARATUS, AND PRO...
- Publication number 20150085161
- Publication date Mar 26, 2015
- SONY CORPORATION
- AKIRA HIRAI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGING APPARATUS, METHOD OF CONTROLLING IMAGING APPARATUS, AND PRO...
- Publication number 20140132803
- Publication date May 15, 2014
- SONY CORPORATION
- AKIRA HIRAI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND METHOD FOR PREPARING SPECIMEN
- Publication number 20140084159
- Publication date Mar 27, 2014
- Hitachi High-Technologies Corporation
- Kaori Yaeshima
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130105690
- Publication date May 2, 2013
- Hitachi High-Technologies Corporation
- Tatsuichi Katou
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS, METHOD OF CONTROLLING IMAGING APPARATUS, AND PRO...
- Publication number 20120044399
- Publication date Feb 23, 2012
- SONY CORPORATION
- Akira HIRAI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Charged Particle Beam Device
- Publication number 20080283744
- Publication date Nov 20, 2008
- Hitachi High-Technologies Corporation
- Satoshi TAKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20080185519
- Publication date Aug 7, 2008
- Hitachi High-Technologies Corporation
- Noritsugu Takahashi
- G01 - MEASURING TESTING

Satoshi Takada

Person

Patents Grantslast 30 patents

Battery device including battery cell group configured by a plurali...

Charged particle beam apparatus

Vehicle battery device

Charged particle beam device

Vehicle battery device

Vehicle battery device

Electron microscope

Continuous image capturing based on detection of a specific state

Method for pattern measurement, method for setting device parameter...

Apparatus, method, and program for controlling display for continuo...

Charged particle beam apparatus

Imaging apparatus, method of controlling imaging apparatus, and pro...

Charged particle beam apparatus

Patents Applicationslast 30 patents

IMAGING DEVICE, IMAGING CONTROL METHOD, AND PROGRAM

INSPECTION SYSTEM

Defect Classification Device and Defect Classification Program

Inspection System and Non-Transitory Computer-Readable Medium

Inspection System

Charged Particle Beam Apparatus

Inspection Method

SEMICONDUCTOR INSPECTION DEVICE AND METHOD FOR INSPECTING SEMICONDU...

CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD

BATTERY PACK

BATTERY PACK AND CELL ASSEMBLY

Computer System of Observation Device and Processing Method

END PLATE SECURING STRUCTURE AND BATTERY DEVICE

Charged Particle Beam Apparatus

BATTERY DEVICE AND METHOD FOR MANUFACTURING BATTERY DEVICE

BATTERY DEVICE AND METHOD FOR MANUFACTURING BATTERY DEVICE

CHARGED PARTICLE BEAM DEVICE

VEHICLE BATTERY DEVICE

VEHICLE BATTERY DEVICE

VEHICLE BATTERY DEVICE

Electron Microscope

Method for Pattern Measurement, Method for Setting Device Parameter...

IMAGING APPARATUS, METHOD OF CONTROLLING IMAGING APPARATUS, AND PRO...

IMAGING APPARATUS, METHOD OF CONTROLLING IMAGING APPARATUS, AND PRO...

SCANNING ELECTRON MICROSCOPE AND METHOD FOR PREPARING SPECIMEN

CHARGED PARTICLE BEAM APPARATUS

IMAGING APPARATUS, METHOD OF CONTROLLING IMAGING APPARATUS, AND PRO...

Charged Particle Beam Device

Charged particle beam apparatus