SATOSHI TAKESHITA

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TOKYO, JP

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Patents Grantslast 30 patents

Information Patent Grant
Performance board and cover member
- Patent number 7,619,426
- Issue date Nov 17, 2009
- Advantest Corporation
- Satoshi Takeshita
- G01 - MEASURING TESTING
Information Patent Grant
IC socket and IC tester
- Patent number 6,464,511
- Issue date Oct 15, 2002
- Advantest Corporation
- Fumio Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS AND CONNECTION DEVICE
- Publication number 20110248737
- Publication date Oct 13, 2011
- Advantest Corporation
- Satoshi TAKESHITA
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE MEMBER, TEST SECTION UNIT AND ELECTRONIC DEVICE HANDLING...
- Publication number 20110227595
- Publication date Sep 22, 2011
- Advantest Corporation
- SATOSHI TAKESHITA
- G01 - MEASURING TESTING
Information Patent Application
TEST SECTION UNIT AND TEST HEAD
- Publication number 20110204913
- Publication date Aug 25, 2011
- Satoshi Takeshita
- G01 - MEASURING TESTING
Information Patent Application
PERFORMANCE BOARD AND COVER MEMBER
- Publication number 20080231309
- Publication date Sep 25, 2008
- Advantest Corporation
- SATOSHI TAKESHITA
- G01 - MEASURING TESTING