Satoshi Tokuda

Person

Shiga, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Dispersive element
- Patent number 11,763,957
- Issue date Sep 19, 2023
- Shimadzu Corporation
- Takuro Izumi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus and method for analyzing chemical state of battery material
- Patent number 11,378,530
- Issue date Jul 5, 2022
- Shimadzu Corporation
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging device
- Patent number 11,327,029
- Issue date May 10, 2022
- Shimadzu Corporation
- Satoshi Sano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray phase imaging apparatus
- Patent number 11,311,260
- Issue date Apr 26, 2022
- Shimadzu Corporation
- Satoshi Sano
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray imaging device
- Patent number 11,272,894
- Issue date Mar 15, 2022
- Shimadzu Corporation
- Satoshi Sano
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray phase imaging system
- Patent number 11,268,916
- Issue date Mar 8, 2022
- Shimadzu Corporation
- Satoshi Sano
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray phase imaging method
- Patent number 11,179,124
- Issue date Nov 23, 2021
- Shimadzu Corporation
- Satoshi Sano
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray imaging apparatus
- Patent number 11,166,687
- Issue date Nov 9, 2021
- Shimadzu Corporation
- Koichi Tanabe
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray spectrometer and chemical state analysis method using the same
- Patent number 11,137,360
- Issue date Oct 5, 2021
- Shimadzu Corporation
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing diffraction grating
- Patent number 10,643,760
- Issue date May 5, 2020
- SHIMADZU CORPORATION
- Takahiro Doki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and semiconductor detector, methods for manufa...
- Patent number 10,468,365
- Issue date Nov 5, 2019
- SHIMADZU CORPORATION
- Hiroyuki Kishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor detector
- Patent number 10,254,417
- Issue date Apr 9, 2019
- Shimadzu Corporation
- Satoshi Tokuda
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector and method of manufacturing the same
- Patent number 9,985,150
- Issue date May 29, 2018
- Shimadzu Corporation
- Toshinori Yoshimuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing radiation detector
- Patent number 8,895,341
- Issue date Nov 25, 2014
- Shimadzu Corporation
- Satoshi Tokuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing radiation detector
- Patent number 8,871,552
- Issue date Oct 28, 2014
- Shimadzu Corporation
- Satoshi Tokuda
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Radiation detector manufacturing method, a radiation detector, and...
- Patent number 8,563,940
- Issue date Oct 22, 2013
- Shimadzu Corporation
- Satoshi Tokuda
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector manufacturing method, a radiation detector, and...
- Patent number 8,405,037
- Issue date Mar 26, 2013
- Shimadzu Corporation
- Satoshi Tokuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light or radiation detector manufacturing method
- Patent number 7,736,941
- Issue date Jun 15, 2010
- Shimadzu Corporation
- Satoshi Tokuda
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing a radiation detector with a polysilicon convert...
- Patent number 7,498,189
- Issue date Mar 3, 2009
- Shimadzu Corporation
- Toshiyuki Sato
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Radiation detector and radiation imaging device equipped with the same
- Patent number 7,420,178
- Issue date Sep 2, 2008
- Shimadzu Corporation
- Satoshi Tokuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation detector and radiation imaging apparatus and method for p...
- Patent number 7,301,155
- Issue date Nov 27, 2007
- Shimadzu Corporation
- Satoshi Tokuda
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic imaging apparatus and manufacturing method therefor
- Patent number 6,949,749
- Issue date Sep 27, 2005
- Shimadzu Corporation
- Satoshi Tokuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation detector
- Patent number 6,885,005
- Issue date Apr 26, 2005
- Shimadzu Corporation
- Kenji Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation detector
- Patent number 6,635,860
- Issue date Oct 21, 2003
- Shimadzu Corporation
- Kenji Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation detector and radiation image taking device
- Patent number 6,512,233
- Issue date Jan 28, 2003
- Shimadzu Corporation
- Toshiyuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-dimensional array type detecting device having a common and ind...
- Patent number 6,407,374
- Issue date Jun 18, 2002
- Shimadzu Corporation
- Toshiyuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating detection element and method for fabricating...
- Patent number 6,344,370
- Issue date Feb 5, 2002
- Sharp Kabushiki Kaisha
- Yoshihiro Izumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-dimensional image detector
- Patent number 6,342,700
- Issue date Jan 29, 2002
- Sharp Kabushiki Kaisha
- Yoshihiro Izumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-dimensional image detector and process for manufacturing the same
- Patent number 6,262,408
- Issue date Jul 17, 2001
- Sharp Kabushiki Kaisha
- Yoshihiro Izumi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DISPERSIVE ELEMENT
- Publication number 20220208408
- Publication date Jun 30, 2022
- Shimadzu Corporation
- Takuro IZUMI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY PHASE IMAGING SYSTEM
- Publication number 20210364453
- Publication date Nov 25, 2021
- Shimadzu Corporation
- Satoshi SANO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY IMAGING DEVICE
- Publication number 20210172885
- Publication date Jun 10, 2021
- Shimadzu Corporation
- Satoshi SANO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY PHASE IMAGING METHOD
- Publication number 20210161492
- Publication date Jun 3, 2021
- Shimadzu Corporation
- Satoshi SANO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY IMAGING DEVICE
- Publication number 20210137476
- Publication date May 13, 2021
- Shimadzu Corporation
- Satoshi SANO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20210015437
- Publication date Jan 21, 2021
- SHIMADZU CORPORATION
- Koichi TANABE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUS AND METHOD FOR ANALYZING CHEMICAL STATE OF BATTERY MATERIAL
- Publication number 20200386696
- Publication date Dec 10, 2020
- Shimadzu Corporation
- Kenji SATO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY PHASE IMAGING APPARATUS
- Publication number 20200337659
- Publication date Oct 29, 2020
- Shimadzu Corporation
- Satoshi SANO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY SPECTROMETER AND CHEMICAL STATE ANALYSIS METHOD USING THE SAME
- Publication number 20200225173
- Publication date Jul 16, 2020
- SHIMADZU CORPORATION
- Kenji SATO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DETECTOR
- Publication number 20180329081
- Publication date Nov 15, 2018
- Shimadzu Corporation
- Satoshi TOKUDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DETECTOR, METHODS FOR MANUFA...
- Publication number 20180331060
- Publication date Nov 15, 2018
- Shimadzu Corporation
- Hiroyuki KISHIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PRODUCING DIFFRACTION GRATING
- Publication number 20180226167
- Publication date Aug 9, 2018
- Shimadzu Corporation
- Takahiro DOKI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
STRUCTURE AND FILM FORMATION METHOD
- Publication number 20170067142
- Publication date Mar 9, 2017
- Shimadzu Corporation
- Akina ICHIOKA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
FILM FORMATION DEVICE AND FILM FORMATION METHOD
- Publication number 20170058394
- Publication date Mar 2, 2017
- Shimadzu Corporation
- Akina ICHIOKA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD OF MANUFACTURING RADIATION DETECTOR AND RADIATION DETECTOR
- Publication number 20140246744
- Publication date Sep 4, 2014
- SHIMADZU CORPORATION
- Masatomo Kaino
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD OF MANUFACTURING RADIATION DETECTOR
- Publication number 20140080243
- Publication date Mar 20, 2014
- Shimadzu Corporation
- Satoshi TOKUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING RADIATION DETECTOR
- Publication number 20130115731
- Publication date May 9, 2013
- SHIMADZU CORPORATION
- Satoshi Tokuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIATION DETECTOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20130026468
- Publication date Jan 31, 2013
- Shimadzu Corporation
- Toshinori Yoshimuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIATION DETECTOR AND RADIOGRAPHIC APPARATUS
- Publication number 20120140881
- Publication date Jun 7, 2012
- Akina Yoshimatsu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RADIATION DETECTOR MANUFACTURING METHOD, A RADIATION DETECTOR, AND...
- Publication number 20120093290
- Publication date Apr 19, 2012
- Satoshi Tokuda
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR MANUFACTURING METHOD, A RADIATION DETECTOR, AND...
- Publication number 20100327172
- Publication date Dec 30, 2010
- Satoshi Tokuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT OR RADIATION DETECTOR MANUFACTURING METHOD
- Publication number 20100029037
- Publication date Feb 4, 2010
- Satoshi Tokuda
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
TWO-DIMENSIONAL SEMICONDUCTOR DETECTOR HAVING MECHANICALLY AND ELEC...
- Publication number 20080217713
- Publication date Sep 11, 2008
- Shimadzu Corporation
- Satoshi Tokuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radiation detector
- Publication number 20050158906
- Publication date Jul 21, 2005
- Shimadzu Corporation
- Toshiyuki Sato
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Two-dimensional semiconductor detector and two-dimensional imaging...
- Publication number 20040262497
- Publication date Dec 30, 2004
- Shimadzu Corporation
- Satoshi Tokuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radiation detector and radiation imaging device equipped with the same
- Publication number 20040256569
- Publication date Dec 23, 2004
- Shimadzu Corporation
- Satoshi Tokuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radiation detector and radiation imaging apparatus and method for p...
- Publication number 20040094721
- Publication date May 20, 2004
- Satoshi Tokuda
- G01 - MEASURING TESTING
Information Patent Application
Radiation detector
- Publication number 20030127598
- Publication date Jul 10, 2003
- Shimadzu Corporation
- Kenji Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radiation detector
- Publication number 20020148949
- Publication date Oct 17, 2002
- Shimadzu Corporation
- Kenji Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electromagnetic imaging apparatus and manufacturing method therefor
- Publication number 20020014593
- Publication date Feb 7, 2002
- Satoshi Tokuda
- H01 - BASIC ELECTRIC ELEMENTS

Satoshi Tokuda

Person

Patents Grantslast 30 patents

Dispersive element

Apparatus and method for analyzing chemical state of battery material

X-ray imaging device

X-ray phase imaging apparatus

X-ray imaging device

X-ray phase imaging system

X-ray phase imaging method

X-ray imaging apparatus

X-ray spectrometer and chemical state analysis method using the same

Method of producing diffraction grating

Semiconductor device and semiconductor detector, methods for manufa...

Semiconductor detector

Radiation detector and method of manufacturing the same

Method of manufacturing radiation detector

Method of manufacturing radiation detector

Radiation detector manufacturing method, a radiation detector, and...

Radiation detector manufacturing method, a radiation detector, and...

Light or radiation detector manufacturing method

Method of producing a radiation detector with a polysilicon convert...

Radiation detector and radiation imaging device equipped with the same

Radiation detector and radiation imaging apparatus and method for p...

Electromagnetic imaging apparatus and manufacturing method therefor

Radiation detector

Radiation detector

Radiation detector and radiation image taking device

Two-dimensional array type detecting device having a common and ind...

Method for fabricating detection element and method for fabricating...

Two-dimensional image detector

Two-dimensional image detector and process for manufacturing the same

Patents Applicationslast 30 patents

DISPERSIVE ELEMENT

X-RAY PHASE IMAGING SYSTEM

X-RAY IMAGING DEVICE

X-RAY PHASE IMAGING METHOD

X-RAY IMAGING DEVICE

X-RAY IMAGING APPARATUS

APPARATUS AND METHOD FOR ANALYZING CHEMICAL STATE OF BATTERY MATERIAL

X-RAY PHASE IMAGING APPARATUS

X-RAY SPECTROMETER AND CHEMICAL STATE ANALYSIS METHOD USING THE SAME

SEMICONDUCTOR DETECTOR

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DETECTOR, METHODS FOR MANUFA...

METHOD OF PRODUCING DIFFRACTION GRATING

STRUCTURE AND FILM FORMATION METHOD

FILM FORMATION DEVICE AND FILM FORMATION METHOD

METHOD OF MANUFACTURING RADIATION DETECTOR AND RADIATION DETECTOR

METHOD OF MANUFACTURING RADIATION DETECTOR

METHOD OF MANUFACTURING RADIATION DETECTOR

RADIATION DETECTOR AND METHOD OF MANUFACTURING THE SAME

RADIATION DETECTOR AND RADIOGRAPHIC APPARATUS

RADIATION DETECTOR MANUFACTURING METHOD, A RADIATION DETECTOR, AND...

RADIATION DETECTOR MANUFACTURING METHOD, A RADIATION DETECTOR, AND...

LIGHT OR RADIATION DETECTOR MANUFACTURING METHOD

TWO-DIMENSIONAL SEMICONDUCTOR DETECTOR HAVING MECHANICALLY AND ELEC...

Radiation detector

Two-dimensional semiconductor detector and two-dimensional imaging...

Radiation detector and radiation imaging device equipped with the same

Radiation detector and radiation imaging apparatus and method for p...

Radiation detector

Radiation detector

Electromagnetic imaging apparatus and manufacturing method therefor