Satoshi Tomimatsu

Person

Kokubunji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of preparing thin film sample piece and charged particle bea...
- Patent number 11,094,503
- Issue date Aug 17, 2021
- Hitachi High-Tech Science Corporation
- Masato Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,832,890
- Issue date Nov 10, 2020
- Hitachi High-Tech Science Corporation
- Masato Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,692,688
- Issue date Jun 23, 2020
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,658,147
- Issue date May 19, 2020
- Hitachi High-Tech Science Corporation
- Makoto Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,629,411
- Issue date Apr 21, 2020
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device and sample production method
- Patent number 10,233,548
- Issue date Mar 19, 2019
- Hitachi High-Technologies Corporation
- Terutaka Nanri
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,236,159
- Issue date Mar 19, 2019
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control device, charged particle beam apparatus, program and method...
- Patent number 9,934,940
- Issue date Apr 3, 2018
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,620,333
- Issue date Apr 11, 2017
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle radiation device and specimen preparation method u...
- Patent number 9,449,786
- Issue date Sep 20, 2016
- Hitachi High-Technologies Corporation
- Miki Tsuchiya
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Charged particle beam device
- Patent number 9,330,883
- Issue date May 3, 2016
- Hitachi High-Technologies Corporation
- Terutaka Nanri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for probe shape processing by ion beam
- Patent number 9,202,672
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device and machining method
- Patent number 9,111,721
- Issue date Aug 18, 2015
- Hitachi High-Technologies Corporation
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample production method
- Patent number 8,933,423
- Issue date Jan 13, 2015
- Hitachi High-Technologies Corporation
- Terutaka Nanri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, position specification method used fo...
- Patent number 8,912,487
- Issue date Dec 16, 2014
- Hitachi High-Technologies Corporation
- Kunio Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,796,651
- Issue date Aug 5, 2014
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Charged particle beam device and sample observation method using a...
- Patent number 8,791,413
- Issue date Jul 29, 2014
- Hitachi High-Technologies Corporation
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source, ion beam processing/observation apparatus, charged part...
- Patent number 8,779,400
- Issue date Jul 15, 2014
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle beam apparatus and film thickness measurement method
- Patent number 8,680,465
- Issue date Mar 25, 2014
- Hitachi High-Technologies Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for processing a micro sample
- Patent number 8,618,520
- Issue date Dec 31, 2013
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,569,719
- Issue date Oct 29, 2013
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Gas field ion source, charged particle microscope, and apparatus
- Patent number 8,530,865
- Issue date Sep 10, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source, ion beam processing/observation apparatus, charged part...
- Patent number 8,481,980
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Electron beam device and electron beam application device using the...
- Patent number 8,450,699
- Issue date May 28, 2013
- Hitachi High-Technologies Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual beam apparatus with tilting sample stage
- Patent number 8,431,891
- Issue date Apr 30, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,405,053
- Issue date Mar 26, 2013
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for processing a microsample
- Patent number 8,222,618
- Issue date Jul 17, 2012
- Hitachi, Ltd.
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Gas field ion source, charged particle microscope, and apparatus
- Patent number 8,115,184
- Issue date Feb 14, 2012
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,999,240
- Issue date Aug 16, 2011
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for specimen fabrication
- Patent number 7,989,782
- Issue date Aug 2, 2011
- Hitachi High-Technologies Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF PREPARING THIN FILM SAMPLE PIECE AND CHARGED PARTICLE BEA...
- Publication number 20200266031
- Publication date Aug 20, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masato SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20200251303
- Publication date Aug 6, 2020
- Hitachi High-Tech Science Corporation
- Toshiaki FUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20190304745
- Publication date Oct 3, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masato SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20190157037
- Publication date May 23, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20180204704
- Publication date Jul 19, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masato SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20180204705
- Publication date Jul 19, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL DEVICE, CHARGED PARTICLE BEAM APPARATUS, PROGRAM AND METHOD...
- Publication number 20170278673
- Publication date Sep 28, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20170278664
- Publication date Sep 28, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Makoto SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20170178858
- Publication date Jun 22, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Radiation Device and Specimen Preparation Method U...
- Publication number 20160071687
- Publication date Mar 10, 2016
- Miki TSUCHIYA
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20160064187
- Publication date Mar 3, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20150014529
- Publication date Jan 15, 2015
- Hitachi High-Technologies Corporation
- Terutaka Nanri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND SAMPLE PRODUCTION METHOD
- Publication number 20140076717
- Publication date Mar 20, 2014
- Hitachi High-Technologies Corporation
- Terutaka Nanri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE AND MACHINING METHOD
- Publication number 20130334034
- Publication date Dec 19, 2013
- Hitachi High-Technologies Corporation
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM PROCESSING APPARATUS
- Publication number 20130320209
- Publication date Dec 5, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PART...
- Publication number 20130284593
- Publication date Oct 31, 2013
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD OF MANUFACTURE OF SAMPLE
- Publication number 20130277552
- Publication date Oct 24, 2013
- Hitachi High-Technologies Corporation
- Terutaka Nanri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20130146765
- Publication date Jun 13, 2013
- Hitachi High-Technologies Corporation
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND SAMPLE PRODUCTION METHOD
- Publication number 20130105302
- Publication date May 2, 2013
- Terutaka Nanri
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ION BEAM APPARATUS AND ION-BEAM PROCESSING METHOD
- Publication number 20130032714
- Publication date Feb 7, 2013
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR PROCESSING A MICROSAMPLE
- Publication number 20120273692
- Publication date Nov 1, 2012
- Hitachi, Ltd
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Charged Particle Beam Device, Position Specification Method Used fo...
- Publication number 20120211652
- Publication date Aug 23, 2012
- Kunio Sakamoto
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Apparatus and Film Thickness Measurement Method
- Publication number 20120187292
- Publication date Jul 26, 2012
- Hitachi High-Technologies Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS FIELD ION SOURCE, CHARGED PARTICLE MICROSCOPE, AND APPARATUS
- Publication number 20120119086
- Publication date May 17, 2012
- Hitachi High-Technologies Corporation
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20120085924
- Publication date Apr 12, 2012
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM DEVICE AND ELECTRON BEAM APPLICATION DEVICE USING THE...
- Publication number 20110240855
- Publication date Oct 6, 2011
- Hitachi High-Technologies Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION Beam System and Machining Method
- Publication number 20110204225
- Publication date Aug 25, 2011
- Hiroyasu Shichi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PROCESSING A MICROSAMPLE
- Publication number 20110174974
- Publication date Jul 21, 2011
- Hitachi, Ltd
- Mitsuo Tokuda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20110140006
- Publication date Jun 16, 2011
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20110114476
- Publication date May 19, 2011
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Satoshi Tomimatsu

Person

Patents Grantslast 30 patents

Method of preparing thin film sample piece and charged particle bea...

Charged particle beam device

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam device and sample production method

Charged particle beam apparatus

Control device, charged particle beam apparatus, program and method...

Charged particle beam apparatus

Charged particle radiation device and specimen preparation method u...

Charged particle beam device

Apparatus and method for probe shape processing by ion beam

Ion beam device and machining method

Charged particle beam device and sample production method

Charged particle beam device, position specification method used fo...

Method and apparatus for specimen fabrication

Charged particle beam device and sample observation method using a...

Ion source, ion beam processing/observation apparatus, charged part...

Charged particle beam apparatus and film thickness measurement method

Method and apparatus for processing a micro sample

Method and apparatus for specimen fabrication

Gas field ion source, charged particle microscope, and apparatus

Ion source, ion beam processing/observation apparatus, charged part...

Electron beam device and electron beam application device using the...

Dual beam apparatus with tilting sample stage

Method and apparatus for specimen fabrication

Method and apparatus for processing a microsample

Gas field ion source, charged particle microscope, and apparatus

Method and apparatus for specimen fabrication

Apparatus and method for specimen fabrication

Patents Applicationslast 30 patents

METHOD OF PREPARING THIN FILM SAMPLE PIECE AND CHARGED PARTICLE BEA...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CONTROL DEVICE, CHARGED PARTICLE BEAM APPARATUS, PROGRAM AND METHOD...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

Charged Particle Radiation Device and Specimen Preparation Method U...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE AND SAMPLE PRODUCTION METHOD

ION BEAM DEVICE AND MACHINING METHOD

ION BEAM PROCESSING APPARATUS

ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PART...

CHARGED PARTICLE BEAM DEVICE AND METHOD OF MANUFACTURE OF SAMPLE

Charged Particle Beam Device and Sample Observation Method

CHARGED PARTICLE BEAM DEVICE AND SAMPLE PRODUCTION METHOD

ION BEAM APPARATUS AND ION-BEAM PROCESSING METHOD

METHOD AND APPARATUS FOR PROCESSING A MICROSAMPLE

Charged Particle Beam Device, Position Specification Method Used fo...

Charged Particle Beam Apparatus and Film Thickness Measurement Method

GAS FIELD ION SOURCE, CHARGED PARTICLE MICROSCOPE, AND APPARATUS

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

ELECTRON BEAM DEVICE AND ELECTRON BEAM APPLICATION DEVICE USING THE...

ION Beam System and Machining Method

METHOD AND APPARATUS FOR PROCESSING A MICROSAMPLE

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

Method and apparatus for specimen fabrication