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Patents Grants
last 30 patents
Information
Patent Grant
Work management system and work management method
Patent number
11,953,891
Issue date
Apr 9, 2024
Topcon Corporation
Satoshi Yanobe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Photogrammetry of building using machine learning based inference
Patent number
11,880,943
Issue date
Jan 23, 2024
Topcon Corporation
Yasufumi Fukuma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Data management system, management method, and storage medium
Patent number
11,868,325
Issue date
Jan 9, 2024
Topcon Corporation
Atsushi Doji
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Photogrammetry of building using machine learning based inference
Patent number
11,393,169
Issue date
Jul 19, 2022
Topcon Corporation
Yasufumi Fukuma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Rotary encoder
Patent number
11,293,786
Issue date
Apr 5, 2022
Topcon Corporation
Satoshi Yanobe
G01 - MEASURING TESTING
Information
Patent Grant
Surveying system
Patent number
10,982,957
Issue date
Apr 20, 2021
TOPCON Corporation
Fumio Ohtomo
G01 - MEASURING TESTING
Information
Patent Grant
Surveying device and survey system
Patent number
10,724,860
Issue date
Jul 28, 2020
Topcon Corporation
Nobuyuki Nishita
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for controlling ultrasonic motor and surveying instrument fo...
Patent number
10,712,153
Issue date
Jul 14, 2020
Topcon Corporation
Kaoru Kumagai
G01 - MEASURING TESTING
Information
Patent Grant
Inclination sensor
Patent number
10,578,433
Issue date
Mar 3, 2020
Topcon Corporation
Satoshi Yanobe
G01 - MEASURING TESTING
Information
Patent Grant
Measurement device and measurement method
Patent number
10,564,265
Issue date
Feb 18, 2020
Topcon Corporation
Takahiro Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Laser scanner
Patent number
10,386,485
Issue date
Aug 20, 2019
TOPCON Corporation
Satoshi Yanobe
G01 - MEASURING TESTING
Information
Patent Grant
Tilt angle measuring device
Patent number
10,323,940
Issue date
Jun 18, 2019
TOPCON Corporation
Masaki Kamiki
G01 - MEASURING TESTING
Information
Patent Grant
Angle detecting device and surveying instrument
Patent number
10,267,659
Issue date
Apr 23, 2019
TOPCON Corporation
Satoshi Yanobe
G01 - MEASURING TESTING
Information
Patent Grant
Surveying instrument
Patent number
10,262,435
Issue date
Apr 16, 2019
Topcon Corporation
Satoshi Yanobe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for controlling ultrasonic motor and surveying instrument fo...
Patent number
10,211,387
Issue date
Feb 19, 2019
Topcon Corporation
Kaoru Kumagai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measuring device
Patent number
10,139,224
Issue date
Nov 27, 2018
TOPCON Corporation
Masaki Kamiki
G01 - MEASURING TESTING
Information
Patent Grant
Automatic leveling method and automatic leveling device
Patent number
10,006,767
Issue date
Jun 26, 2018
Kabushiki Kaisha Topcon
Homare Momiyama
G01 - MEASURING TESTING
Information
Patent Grant
Measuring system, and portable radio transceiver and measurement po...
Patent number
9,989,632
Issue date
Jun 5, 2018
Kabushiki Kaisha Topcon
Satoshi Yanobe
G01 - MEASURING TESTING
Information
Patent Grant
Method for controlling ultrasonic motor and surveying instrument fo...
Patent number
9,979,324
Issue date
May 22, 2018
Topcon Corporation
Kaoru Kumagai
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Measuring device and tilt sensor
Patent number
9,927,229
Issue date
Mar 27, 2018
Kabushiki Kaisha Topcon
Nobuyuki Nishita
G01 - MEASURING TESTING
Information
Patent Grant
Absolute rotary encoder for surveying device
Patent number
9,891,046
Issue date
Feb 13, 2018
Kabushiki Kaisha Topcon
Satoshi Yanobe
G01 - MEASURING TESTING
Information
Patent Grant
Angle detection device and survey instrument including the same
Patent number
9,714,848
Issue date
Jul 25, 2017
Kabushiki Kaisha Topcon
Satoshi Yanobe
G01 - MEASURING TESTING
Information
Patent Grant
Simplified distance meter
Patent number
9,500,479
Issue date
Nov 22, 2016
Kabushiki Kaisha Topcon
Kaoru Kumagai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...
Publication number
20240272102
Publication date
Aug 15, 2024
TOPCON CORPORATION
Shigenori NAGANO
G01 - MEASURING TESTING
Information
Patent Application
NONDESTRUCTIVE INSPECTION SYSTEM
Publication number
20240192153
Publication date
Jun 13, 2024
TOPCON CORPORATION
Shigenori NAGANO
G01 - MEASURING TESTING
Information
Patent Application
NONDESTRUCTIVE INSPECTING DEVICE
Publication number
20240183801
Publication date
Jun 6, 2024
TOPCON CORPORATION
Shigenori NAGANO
G01 - MEASURING TESTING
Information
Patent Application
SURVEYING APPARATUS, SURVEYING METHOD, AND SURVEYING PROGRAM
Publication number
20230314610
Publication date
Oct 5, 2023
TOPCON CORPORATION
Satoshi YANOBE
G01 - MEASURING TESTING
Information
Patent Application
DATA MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND STORAGE MEDIUM
Publication number
20230074990
Publication date
Mar 9, 2023
TOPCON CORPORATION
Atsushi DOJI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RECORDING MEDIUM, AND SYSTEM
Publication number
20230064228
Publication date
Mar 2, 2023
TOPCON CORPORATION
Satoshi WADA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DATA MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND STORAGE MEDIUM
Publication number
20230015599
Publication date
Jan 19, 2023
TOPCON CORPORATION
Atsushi DOJI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DATA MANAGEMENT SYSTEM, MANAGEMENT METHOD, AND STORAGE MEDIUM
Publication number
20220414066
Publication date
Dec 29, 2022
TOPCON CORPORATION
Atsushi DOJI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
REVERSING ACTUATION TYPE INERTIA DETECTING DEVICE AND SURVEYING INS...
Publication number
20220317149
Publication date
Oct 6, 2022
TOPCON Corporation
Fumio Ohtomo
G01 - MEASURING TESTING
Information
Patent Application
PHOTOGRAMMETRY OF BUILDING USING MACHINE LEARNING BASED INFERENCE
Publication number
20220254107
Publication date
Aug 11, 2022
TOPCON CORPORATION
Yasufumi FUKUMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CONSTRUCTION MODEL CREATION SYSTEM, CONSTRUCTION MODEL CREATING MET...
Publication number
20210406415
Publication date
Dec 30, 2021
TOPCON CORPORATION
Atsushi DOJI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WORK MANAGEMENT SYSTEM AND WORK MANAGEMENT METHOD
Publication number
20210341908
Publication date
Nov 4, 2021
TOPCON CORPORATION
Satoshi YANOBE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PHOTOGRAMMETRY OF BUILDING USING MACHINE LEARNING BASED INFERENCE
Publication number
20210279960
Publication date
Sep 9, 2021
TOPCON CORPORATION
Yasufumi FUKUMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM FOR BUILDING PHOTOGRAMMETRY
Publication number
20210256679
Publication date
Aug 19, 2021
TOPCON CORPORATION
Yasufumi FUKUMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ROTARY ENCODER
Publication number
20200103255
Publication date
Apr 2, 2020
TOPCON CORPORATION
Satoshi YANOBE
G01 - MEASURING TESTING
Information
Patent Application
Surveying System
Publication number
20190063922
Publication date
Feb 28, 2019
TOPCON Corporation
Fumio Ohtomo
G01 - MEASURING TESTING
Information
Patent Application
SURVEYING DEVICE AND SURVEY SYSTEM
Publication number
20180231380
Publication date
Aug 16, 2018
TOPCON CORPORATION
Nobuyuki NISHITA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INCLINATION SENSOR
Publication number
20180135981
Publication date
May 17, 2018
TOPCON CORPORATION
Satoshi YANOBE
G01 - MEASURING TESTING
Information
Patent Application
SURVEYING INSTRUMENT
Publication number
20180137650
Publication date
May 17, 2018
TOPCON CORPORATION
Satoshi YANOBE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASUREMENT DEVICE AND MEASUREMENT METHOD
Publication number
20180095166
Publication date
Apr 5, 2018
TOPCON CORPORATION
Takahiro INOUE
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTROLLING ULTRASONIC MOTOR AND SURVEYING INSTRUMENT FO...
Publication number
20170310248
Publication date
Oct 26, 2017
TOPCON CORPORATION
Kaoru KUMAGAI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTROLLING ULTRASONIC MOTOR AND SURVEYING INSTRUMENT FO...
Publication number
20170309806
Publication date
Oct 26, 2017
TOPCON CORPORATION
Kaoru KUMAGAI
B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information
Patent Application
METHOD FOR CONTROLLING ULTRASONIC MOTOR AND SURVEYING INSTRUMENT FO...
Publication number
20170299386
Publication date
Oct 19, 2017
TOPCON CORPORATION
Kaoru KUMAGAI
G01 - MEASURING TESTING
Information
Patent Application
Laser Scanner
Publication number
20170160383
Publication date
Jun 8, 2017
TOPCON Corporation
Satoshi Yanobe
G01 - MEASURING TESTING
Information
Patent Application
Angle Detecting Device And Surveying Instrument
Publication number
20170160108
Publication date
Jun 8, 2017
TOPCON Corporation
Satoshi Yanobe
G01 - MEASURING TESTING
Information
Patent Application
Measuring Device
Publication number
20170108334
Publication date
Apr 20, 2017
TOPCON Corporation
Masaki Kamiki
G01 - MEASURING TESTING
Information
Patent Application
Tilt Angle Measuring Device
Publication number
20170108333
Publication date
Apr 20, 2017
TOPCON Corporation
Masaki Kamiki
G01 - MEASURING TESTING
Information
Patent Application
Automatic Leveling Method And Automatic Leveling Device
Publication number
20160290800
Publication date
Oct 6, 2016
Kabushiki Kaisha TOPCON
Homare Momiyama
G01 - MEASURING TESTING
Information
Patent Application
MEASURING SYSTEM, AND PORTABLE RADIO TRANSCEIVER AND MEASUREMENT PO...
Publication number
20160109560
Publication date
Apr 21, 2016
KABUSHIKI KAISHA TOPCON
Satoshi YANOBE
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF INTERPOLATING READ-OUT SIGNAL OF INCREMENTAL ENCODER
Publication number
20160103001
Publication date
Apr 14, 2016
KABUSHIKI KAISHA TOPCON
Satoshi YANOBE
G01 - MEASURING TESTING