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Satoshi YASUTOMI
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Scanner system and scan method
Patent number
11,828,931
Issue date
Nov 28, 2023
Topcon Corporation
Satoshi Yasutomi
G01 - MEASURING TESTING
Information
Patent Grant
Target unit
Patent number
11,789,151
Issue date
Oct 17, 2023
Topcon Corporation
Satoshi Yasutomi
G01 - MEASURING TESTING
Information
Patent Grant
Eyewear display system
Patent number
11,663,786
Issue date
May 30, 2023
Topcon Corporation
Satoshi Yasutomi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Surveying system and surveying method
Patent number
11,536,841
Issue date
Dec 27, 2022
Topcon Corporation
Satoshi Yasutomi
G01 - MEASURING TESTING
Information
Patent Grant
Point cloud data processing method and point cloud data processing...
Patent number
11,238,609
Issue date
Feb 1, 2022
Topcon Corporation
Satoshi Yasutomi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Data processing device, data processing method, and data processing...
Patent number
11,002,549
Issue date
May 11, 2021
Topcon Corporation
Satoshi Yasutomi
G01 - MEASURING TESTING
Information
Patent Grant
Point cloud data display system
Patent number
11,004,250
Issue date
May 11, 2021
Topcon Corporation
Satoshi Yasutomi
G01 - MEASURING TESTING
Information
Patent Grant
Angle detection system
Patent number
10,837,767
Issue date
Nov 17, 2020
Topcon Corporation
Satoshi Yasutomi
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
TARGET UNIT
Publication number
20230070967
Publication date
Mar 9, 2023
TOPCON CORPORATION
Satoshi YASUTOMI
G01 - MEASURING TESTING
Information
Patent Application
EYEWEAR DISPLAY SYSTEM AND EYEWEAR DISPLAY METHOD
Publication number
20210404808
Publication date
Dec 30, 2021
TOPCON CORPORATION
Satoshi YASUTOMI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EYEWEAR DISPLAY SYSTEM
Publication number
20210350627
Publication date
Nov 11, 2021
TOPCON CORPORATION
Satoshi YASUTOMI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ANGLE DETECTION SYSTEM AND ANGLE DETECTION METHOD
Publication number
20210270602
Publication date
Sep 2, 2021
TOPCON CORPORATION
Satoshi YASUTOMI
G01 - MEASURING TESTING
Information
Patent Application
ANGLE DETECTION SYSTEM AND ANGLE DETECTION METHOD
Publication number
20210270640
Publication date
Sep 2, 2021
TOPCON CORPORATION
Satoshi YASUTOMI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SCANNER SYSTEM AND SCAN METHOD
Publication number
20210124165
Publication date
Apr 29, 2021
TOPCON CORPORATION
Satoshi YASUTOMI
G02 - OPTICS
Information
Patent Application
LASER SCANNER
Publication number
20210124021
Publication date
Apr 29, 2021
TOPCON CORPORATION
Satoshi YASUTOMI
G01 - MEASURING TESTING
Information
Patent Application
POINT CLOUD DATA PROCESSING METHOD AND POINT CLOUD DATA PROCESSING...
Publication number
20200311963
Publication date
Oct 1, 2020
TOPCON CORPORATION
Satoshi YASUTOMI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ANGLE DETECTION SYSTEM
Publication number
20200109941
Publication date
Apr 9, 2020
TOPCON CORPORATION
Satoshi YASUTOMI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SURVEYING SYSTEM, SCANNER DEVICE, TARGET UNIT, AND SURVEYING METHOD
Publication number
20200103525
Publication date
Apr 2, 2020
TOPCON CORPORATION
Satoshi YASUTOMI
G01 - MEASURING TESTING
Information
Patent Application
POINT CLOUD DATA DISPLAY SYSTEM
Publication number
20200105043
Publication date
Apr 2, 2020
TOPCON CORPORATION
Satoshi YASUTOMI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DATA PROCESSING DEVICE, DATA PROCESSING METHOD, AND DATA PROCESSING...
Publication number
20190249989
Publication date
Aug 15, 2019
TOPCON CORPORATION
Satoshi YASUTOMI
G01 - MEASURING TESTING