Satoshi YOSHITANI

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Form measuring instrument and method of detecting abnormality
- Patent number 11,555,683
- Issue date Jan 17, 2023
- Mitutoyo Corporation
- Satoshi Yoshitani
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate measuring unit and method for recognizing measuring probe
- Patent number 10,788,312
- Issue date Sep 29, 2020
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
FORM MEASURING INSTRUMENT AND METHOD OF DETECTING ABNORMALITY
- Publication number 20220146246
- Publication date May 12, 2022
- MITUTOYO CORPORATION
- Satoshi YOSHITANI
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASURING UNIT AND METHOD FOR RECOGNIZING MEASURING PROBE
- Publication number 20180372480
- Publication date Dec 27, 2018
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- G06 - COMPUTING CALCULATING COUNTING