Satwant Singh

Follow

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Burn-in using system-level test hardware
- Patent number 7,519,880
- Issue date Apr 14, 2009
- Advanced Micro Devices, Inc.
- Trent William Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automated system level testing
- Patent number 6,625,758
- Issue date Sep 23, 2003
- Advanced Micro Devices, Inc.
- Satwant Singh
- G06 - COMPUTING CALCULATING COUNTING