Satyavolu Papa Rao

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device manufactured by reducing hillock formation in...
- Patent number 7,745,335
- Issue date Jun 29, 2010
- Texas Instruments Incorporated
- Ju-Ai Ruan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray defect detection in integrated circuit metallization
- Patent number 6,834,117
- Issue date Dec 21, 2004
- Texas Instruments Incorporated
- Satyavolu Papa Rao
- G01 - MEASURING TESTING
Information Patent Grant
Processes for chemical-mechanical polishing of a semiconductor wafer
- Patent number 6,579,798
- Issue date Jun 17, 2003
- Texas Instruments Incorporated
- Basab Chatterjee
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURED BY REDUCING HILLOCK FORMATION IN...
- Publication number 20080150131
- Publication date Jun 26, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Ju-Ai Ruan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integration of pore sealing liner into dual-damascene methods and d...
- Publication number 20070117371
- Publication date May 24, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Edward Raymond Engbrecht
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Energy beam treatment to improve packaging reliability
- Publication number 20070032094
- Publication date Feb 8, 2007
- Texas Instruments, Incorporated
- Ting Y. Tsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Single mask MIM capacitor and resistor with in trench copper drift...
- Publication number 20060160299
- Publication date Jul 20, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Satyavolu Srinivas Papa Rao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ferroelectric capacitor having a substantially planar dielectric la...
- Publication number 20050239218
- Publication date Oct 27, 2005
- TEXAS INSTRUMENTS INCORPORATED
- Sanjeev Aggarwal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Diffusion barrier for copper lines in integrated circuits
- Publication number 20050037613
- Publication date Feb 17, 2005
- Stephan Grunow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface defect elimination using directed beam method
- Publication number 20040157456
- Publication date Aug 12, 2004
- Lindsey H. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIM capacitors and methods for fabricating same
- Publication number 20040124496
- Publication date Jul 1, 2004
- Satyavolu S. Papa Rao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIM capacitors and methods for fabricating same
- Publication number 20040126981
- Publication date Jul 1, 2004
- Satyavolu S. Papa Rao
- H01 - BASIC ELECTRIC ELEMENTS

Satyavolu Papa Rao

Person

Patents Grantslast 30 patents

Semiconductor device manufactured by reducing hillock formation in...

X-ray defect detection in integrated circuit metallization

Processes for chemical-mechanical polishing of a semiconductor wafer

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE MANUFACTURED BY REDUCING HILLOCK FORMATION IN...

Integration of pore sealing liner into dual-damascene methods and d...

Energy beam treatment to improve packaging reliability

Single mask MIM capacitor and resistor with in trench copper drift...

Ferroelectric capacitor having a substantially planar dielectric la...

Diffusion barrier for copper lines in integrated circuits

Surface defect elimination using directed beam method

MIM capacitors and methods for fabricating same

MIM capacitors and methods for fabricating same