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Saurabh Chauhan
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Inder Puri, IN
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Patent Grant
System and method for debugging scan chains
Patent number
8,458,541
Issue date
Jun 4, 2013
FREESCALE SEMICONDUCTOR, INC.
Sandeep Jain
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SYSTEM AND METHOD FOR DEBUGGING SCAN CHAINS
Publication number
20120246531
Publication date
Sep 27, 2012
FREESCALE SEMICONDUCTOR, INC.
Sandeep Jain
G01 - MEASURING TESTING