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Saurabh GUPTA
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Hsinchu, TW
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Patents Grants
last 30 patents
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Patent Grant
Apparatus and method for on-chip sampling of dynamic IR voltage drop
Patent number
8,614,571
Issue date
Dec 24, 2013
Taiwan Semiconductor Manufacturing Co., Ltd.
Nan-Hsin Tseng
G01 - MEASURING TESTING
Information
Patent Grant
Ultra high resolution timing measurement
Patent number
8,305,847
Issue date
Nov 6, 2012
Taiwan Semiconductor Manufacturing Company, Ltd.
Nan-Hsin Tseng
G04 - HOROLOGY
Information
Patent Grant
Ultra high resolution timing measurement
Patent number
7,986,591
Issue date
Jul 26, 2011
Taiwan Semiconductor Manufacturing Company, Ltd.
Nan-Hsin Tseng
G04 - HOROLOGY
Patents Applications
last 30 patents
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Patent Application
APPARATUS AND METHOD FOR ON-CHIP SAMPLING OF DYNAMIC IR VOLTAGE DROP
Publication number
20130127441
Publication date
May 23, 2013
Taiwan Semiconductor Manufacturing Co., LTD
Nan-Hsin TSENG
G01 - MEASURING TESTING
Information
Patent Application
Method for Detecting Small Delay Defects
Publication number
20120112763
Publication date
May 10, 2012
Taiwan Semiconductor Manufacturing Company, Ltd.
Sandeep Kumar Goel
G01 - MEASURING TESTING
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Patent Application
ULTRA HIGH RESOLUTION TIMING MEASUREMENT
Publication number
20110273967
Publication date
Nov 10, 2011
Taiwan Semiconductor Manufacturing Company, Ltd.
Nan-Hsin TSENG
G04 - HOROLOGY
Information
Patent Application
ULTRA HIGH RESOLUTION TIMING MEASUREMENT
Publication number
20110038451
Publication date
Feb 17, 2011
Taiwan Semiconductor Manufacturing Company, Ltd.
Nan-Hsin TSENG
G04 - HOROLOGY