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Sayaka ASADA
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Monitoring the cleaning status of an automatic analyzer
Patent number
12,123,884
Issue date
Oct 22, 2024
HITACHI HIGH-TECH CORPORATION
Kenichi Yagi
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
11,656,238
Issue date
May 23, 2023
HITACHI HIGH-TECH CORPORATION
Takashi Nakasawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
AUTOMATIC ANALYZER
Publication number
20220034923
Publication date
Feb 3, 2022
HITACHI HIGH-TECH CORPORATION
Kenichi YAGI
G01 - MEASURING TESTING
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Patent Application
AUTOMATIC ANALYZER
Publication number
20190346468
Publication date
Nov 14, 2019
Hitachi High-Technologies Corporation
Takashi NAKASAWA
G01 - MEASURING TESTING