Sayaka MAKISE

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Patents Grantslast 30 patents

Information Patent Grant
Method of evaluating silicon layer and a method of manufacturing si...
- Patent number 11,183,433
- Issue date Nov 23, 2021
- Sumco Corporation
- Sayaka Makise
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MEASURING CONTACT ANGLE OF SILICON WAFER AND METHOD OF EV...
- Publication number 20240344951
- Publication date Oct 17, 2024
- SUMCO CORPORATION
- Sayaka MAKISE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CLEANING SEMICONDUCTOR WAFER AND METHOD OF MANUFACTURING...
- Publication number 20240290665
- Publication date Aug 29, 2024
- SUMCO CORPORATION
- Ryosuke TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EVALUATING SILICON LAYER AND A METHOD OF MANUFACTURING SI...
- Publication number 20200343149
- Publication date Oct 29, 2020
- SUMCO CORPORATION
- Sayaka MAKISE
- H01 - BASIC ELECTRIC ELEMENTS