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Sayaka Sarwar
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Automatic analyzer
Patent number
9,423,412
Issue date
Aug 23, 2016
Hitachi High-Technologies Corporation
Sayaka Sarwar
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analysis device
Patent number
9,383,375
Issue date
Jul 5, 2016
Hitachi High-Technologies Corporation
Sayaka Sarwar
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
9,341,638
Issue date
May 17, 2016
Hitachi High-Technologies Corporation
Sayaka Sarwar
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20200264206
Publication date
Aug 20, 2020
Hitachi High-Technologies Corporation
Sayaka SARWAR
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE
Publication number
20140322080
Publication date
Oct 30, 2014
Sayaka Sarwar
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20140147335
Publication date
May 29, 2014
Hitachi High-Technologies Corporation
Sayaka Sarwar
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20130280130
Publication date
Oct 24, 2013
Roche Diagnostics Operations.Inc
Sayaka Sarwar
G01 - MEASURING TESTING