Sayaka Sarwar

Person

  • Tokyo, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer

    • Patent number 9,423,412
    • Issue date Aug 23, 2016
    • Hitachi High-Technologies Corporation
    • Sayaka Sarwar
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device

    • Patent number 9,383,375
    • Issue date Jul 5, 2016
    • Hitachi High-Technologies Corporation
    • Sayaka Sarwar
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer

    • Patent number 9,341,638
    • Issue date May 17, 2016
    • Hitachi High-Technologies Corporation
    • Sayaka Sarwar
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER

    • Publication number 20200264206
    • Publication date Aug 20, 2020
    • Hitachi High-Technologies Corporation
    • Sayaka SARWAR
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE

    • Publication number 20140322080
    • Publication date Oct 30, 2014
    • Sayaka Sarwar
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER

    • Publication number 20140147335
    • Publication date May 29, 2014
    • Hitachi High-Technologies Corporation
    • Sayaka Sarwar
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER

    • Publication number 20130280130
    • Publication date Oct 24, 2013
    • Roche Diagnostics Operations.Inc
    • Sayaka Sarwar
    • G01 - MEASURING TESTING