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Scott A. CHALMERS
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San Diego, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Optical instrumentation including a spatially variable filter
Patent number
11,099,068
Issue date
Aug 24, 2021
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Optical profilometer with color outputs
Patent number
10,948,284
Issue date
Mar 16, 2021
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Determining focus condition in spectral reflectance system
Patent number
10,724,900
Issue date
Jul 28, 2020
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Optical system for use with microscope
Patent number
10,620,420
Issue date
Apr 14, 2020
Filmetrics, Inc.
Scott A. Chalmers
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
High-lifetime broadband light source for low-power applications
Patent number
10,571,615
Issue date
Feb 25, 2020
Filmetrics, Inc.
Scott A. Chalmers
F21 - LIGHTING
Information
Patent Grant
Automatic real-time wavelength calibration of fiber-optic-based spe...
Patent number
10,247,605
Issue date
Apr 2, 2019
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Optical spectrometer configuration including spatially variable fil...
Patent number
10,240,981
Issue date
Mar 26, 2019
Filmetrics, Inc.
Matthew F. Ross
G01 - MEASURING TESTING
Information
Patent Grant
Combining normal-incidence reflectance and transmittance with non-n...
Patent number
9,019,484
Issue date
Apr 28, 2015
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Correction of second-order diffraction effects in fiber-optic-based...
Patent number
8,908,177
Issue date
Dec 9, 2014
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Thin-film metrology using spectral reflectance with an intermediate...
Patent number
7,502,119
Issue date
Mar 10, 2009
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Determining wafer orientation in spectral imaging
Patent number
7,151,609
Issue date
Dec 19, 2006
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for high-speed thickness mapping of patterned...
Patent number
7,095,511
Issue date
Aug 22, 2006
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Rapid and accurate thin film measurement of individual layers in a...
Patent number
6,204,922
Issue date
Mar 20, 2001
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer configured to provide simultaneous multiple intensity...
Patent number
6,184,985
Issue date
Feb 6, 2001
Filmetrics, Inc.
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Grant
Rapid and accurate end point detection in a noisy environment
Patent number
6,172,756
Issue date
Jan 9, 2001
Filmetrics, Inc.
Scott A. Chalmers
B24 - GRINDING POLISHING
Information
Patent Grant
Integrated multi-channel optical-based flux monitor and method
Patent number
6,075,588
Issue date
Jun 13, 2000
The Regents of the University of California
Paul Ruengrit Pinsukanjana
G01 - MEASURING TESTING
Information
Patent Grant
Methods of making nanometer period optical gratings
Patent number
5,166,100
Issue date
Nov 24, 1992
Arthur C. Gossard
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL PROFILOMETER
Publication number
20180252518
Publication date
Sep 6, 2018
Scott A. CHALMERS
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PROFILOMETER
Publication number
20170314914
Publication date
Nov 2, 2017
Scott A. CHALMERS
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PROFILOMETER
Publication number
20170254641
Publication date
Sep 7, 2017
Scott A. CHALMERS
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SPECTROMETER CONFIGURATION INCLUDING SPATIALLY VARIABLE FIL...
Publication number
20170160134
Publication date
Jun 8, 2017
Matthew F. ROSS
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SYSTEM FOR USE WITH MICROSCOPE
Publication number
20170108688
Publication date
Apr 20, 2017
Scott A. Chalmers
G02 - OPTICS
Information
Patent Application
DETERMINING FOCUS CONDITION IN SPECTRAL REFLECTANCE SYSTEM
Publication number
20170108377
Publication date
Apr 20, 2017
Scott A. CHALMERS
G01 - MEASURING TESTING
Information
Patent Application
HIGH-LIFETIME BROADBAND LIGHT SOURCE FOR LOW-POWER APPLICATIONS
Publication number
20160356938
Publication date
Dec 8, 2016
Scott A. CHALMERS
G02 - OPTICS
Information
Patent Application
HIGH-LIFETIME BROADBAND LIGHT SOURCE FOR LOW-POWER APPLICATIONS
Publication number
20130265795
Publication date
Oct 10, 2013
Scott A. CHALMERS
G02 - OPTICS
Information
Patent Application
CORRECTION OF SECOND-ORDER DIFFRACTION EFFECTS IN FIBER-OPTIC-BASED...
Publication number
20130258333
Publication date
Oct 3, 2013
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC REAL-TIME WAVELENGTH CALIBRATION OF FIBER-OPTIC-BASED SPE...
Publication number
20130250294
Publication date
Sep 26, 2013
Scott A. CHALMERS
G01 - MEASURING TESTING
Information
Patent Application
Combining Normal-Incidence Reflectance and Transmittance with Non-N...
Publication number
20120176604
Publication date
Jul 12, 2012
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Application
Fiber-Based Optical Probe With Decreased Sample-Positioning Sensiti...
Publication number
20110170097
Publication date
Jul 14, 2011
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Application
Thin-film metrology using spectral reflectance with an intermediate...
Publication number
20080180684
Publication date
Jul 31, 2008
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Application
Determining wafer orientation in spectral imaging
Publication number
20060164657
Publication date
Jul 27, 2006
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Application
Spectral imaging of substrates
Publication number
20060166608
Publication date
Jul 27, 2006
Scott A. Chalmers
B24 - GRINDING POLISHING
Information
Patent Application
Method and apparatus for high-speed thickness mapping of patterned...
Publication number
20050174583
Publication date
Aug 11, 2005
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for high-speed thickness mapping of patterned...
Publication number
20050174584
Publication date
Aug 11, 2005
Scott A. Chalmers
G01 - MEASURING TESTING
Information
Patent Application
Whole-substrate spectral imaging system for CMP
Publication number
20040259472
Publication date
Dec 23, 2004
Scott A. Chalmers
B24 - GRINDING POLISHING
Information
Patent Application
Method and apparatus for high-speed thickness mapping of patterned...
Publication number
20020030826
Publication date
Mar 14, 2002
Scott A. Chalmers
G01 - MEASURING TESTING