Scott A. Estes

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Copper contamination detection method and system for monitoring cop...
- Patent number 8,236,580
- Issue date Aug 7, 2012
- International Business Machines Corporation
- Jay Sanford Burnham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Copper contamination detection method and system for monitoring cop...
- Patent number 7,957,917
- Issue date Jun 7, 2011
- International Business Machines Corporation
- Jay Sanford Burnham
- G01 - MEASURING TESTING
Information Patent Grant
Copper contamination detection method and system for monitoring cop...
- Patent number 7,888,142
- Issue date Feb 15, 2011
- International Business Machines Corporation
- Jay Sanford Burnham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corrosion inhibitor additives to prevent semiconductor device bond-...
- Patent number 7,855,130
- Issue date Dec 21, 2010
- International Business Machines Corporation
- Robert R Cadieux
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
Etch apparatus
- Patent number 7,332,054
- Issue date Feb 19, 2008
- International Business Machines Corporation
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Slurry for mechanical polishing (CMP) of metals and use thereof
- Patent number 6,812,193
- Issue date Nov 2, 2004
- International Business Machines Corporation
- Michael Todd Brigham
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Grant
Method of inhibiting contaminants using dilute acid rinse
- Patent number 6,758,912
- Issue date Jul 6, 2004
- International Business Machines Corporation
- Virginia Chi-Chuen Chao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Etch process and apparatus therefor
- Patent number 6,699,400
- Issue date Mar 2, 2004
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of minimizing contaminating deposits using dilute acid rinse
- Patent number 6,494,966
- Issue date Dec 17, 2002
- International Business Machines Corporation
- Virginia Chi-Chuen Chao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for cleaning semiconductor devices
- Patent number 6,191,085
- Issue date Feb 20, 2001
- International Business Machines Corporation
- Emanuel I. Cooper
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Grant
Dilute acid rinse after develop for chrome etch
- Patent number 6,162,565
- Issue date Dec 19, 2000
- International Business Machines Corporation
- Virginia Chi-Chuen Chao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for cleaning semiconductor devices
- Patent number 5,962,384
- Issue date Oct 5, 1999
- International Business Machines Corporation
- Emanuel I. Cooper
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Grant
Low stress electrodeposition of gold for x-ray mask fabrication
- Patent number 5,459,001
- Issue date Oct 17, 1995
- International Business Machines Corporation
- Scott A. Estes
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Low stress electrodeposition of gold for X-ray mask fabrication
- Patent number 5,318,687
- Issue date Jun 7, 1994
- International Business Machines Corporation
- Scott A. Estes
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Patents Applicationslast 30 patents

Information Patent Application
COPPER CONTAMINATION DETECTION METHOD AND SYSTEM FOR MONITORING COP...
- Publication number 20110086442
- Publication date Apr 14, 2011
- International Business Machines Corporation
- Jay Sanford Burnham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COPPER CONTAMINATION DETECTION METHOD AND SYSTEM FOR MONITORING COP...
- Publication number 20090087928
- Publication date Apr 2, 2009
- Jay Sanford Burnham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COPPER CONTAMINATION DETECTION METHOD AND SYSTEM FOR MONITORING COP...
- Publication number 20090088984
- Publication date Apr 2, 2009
- Jay Sanford Burnham
- G01 - MEASURING TESTING
Information Patent Application
ETCH APPARATUS
- Publication number 20080066864
- Publication date Mar 20, 2008
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CORROSION INHIBITOR ADDITIVES TO PREVENT SEMICONDUCTOR DEVICE BOND-...
- Publication number 20040209443
- Publication date Oct 21, 2004
- International Business Machines Corporation
- Robert R. Cadieux
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Application
Etch process and apparatus therefor
- Publication number 20040144750
- Publication date Jul 29, 2004
- Arne W. Ballantine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Slurry for mechanical polishing (CMP) of metals and use thereof
- Publication number 20030073593
- Publication date Apr 17, 2003
- Michael Todd Brigham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of inhibiting contaminants using dilute acid rinse
- Publication number 20030051740
- Publication date Mar 20, 2003
- Virginia Chi-Chuen Chao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of minimizing contaminating deposits using dilute acid rinse
- Publication number 20010001958
- Publication date May 31, 2001
- Virginia Chi-Chuen Chao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Scott A. Estes

Person

Patents Grantslast 30 patents

Copper contamination detection method and system for monitoring cop...

Copper contamination detection method and system for monitoring cop...

Copper contamination detection method and system for monitoring cop...

Corrosion inhibitor additives to prevent semiconductor device bond-...

Etch apparatus

Slurry for mechanical polishing (CMP) of metals and use thereof

Method of inhibiting contaminants using dilute acid rinse

Etch process and apparatus therefor

Method of minimizing contaminating deposits using dilute acid rinse

Method for cleaning semiconductor devices

Dilute acid rinse after develop for chrome etch

Method for cleaning semiconductor devices

Low stress electrodeposition of gold for x-ray mask fabrication

Low stress electrodeposition of gold for X-ray mask fabrication

Patents Applicationslast 30 patents

COPPER CONTAMINATION DETECTION METHOD AND SYSTEM FOR MONITORING COP...

COPPER CONTAMINATION DETECTION METHOD AND SYSTEM FOR MONITORING COP...

COPPER CONTAMINATION DETECTION METHOD AND SYSTEM FOR MONITORING COP...

ETCH APPARATUS

CORROSION INHIBITOR ADDITIVES TO PREVENT SEMICONDUCTOR DEVICE BOND-...

Etch process and apparatus therefor

Slurry for mechanical polishing (CMP) of metals and use thereof

Method of inhibiting contaminants using dilute acid rinse

Method of minimizing contaminating deposits using dilute acid rinse