Scott Allen Harsila

Person

Shoreline, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Modular configuration for coordinate measuring machine probe
- Patent number 11,733,021
- Issue date Aug 22, 2023
- Mitutoyo Corporation
- Dawn Alisa Keehnel
- G01 - MEASURING TESTING
Information Patent Grant
Shielding for sensor configuration and alignment of coordinate meas...
- Patent number 11,713,956
- Issue date Aug 1, 2023
- Mitutoyo Corporation
- Dawn Alisa Keehnel
- G01 - MEASURING TESTING
Information Patent Grant
Inductive position sensor signal gain control for coordinate measur...
- Patent number 11,644,299
- Issue date May 9, 2023
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Grant
Workpiece holder for utilization in metrology system for measuring...
- Patent number 11,635,291
- Issue date Apr 25, 2023
- Mitutoyo Corporation
- Scott Allen Harsila
- G01 - MEASURING TESTING
Information Patent Grant
Inductive position detection configuration for indicating a measure...
- Patent number 10,914,570
- Issue date Feb 9, 2021
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Grant
Inductive position detection configuration for indicating a measure...
- Patent number 10,866,080
- Issue date Dec 15, 2020
- Mitutoyo Corporation
- Ted Staton Cook
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate measurement probe body
- Patent number 10,852,119
- Issue date Dec 1, 2020
- Mitutoyo Corporation
- Scott Allen Harsila
- G01 - MEASURING TESTING
Information Patent Grant
Modulation monitoring system for use with an imaging system that in...
- Patent number 10,768,404
- Issue date Sep 8, 2020
- Mitutoyo Corporation
- Scott Allen Harsila
- G02 - OPTICS
Information Patent Grant
Measurement device with multiplexed position signals
- Patent number 9,791,262
- Issue date Oct 17, 2017
- Mitutoyo Corporation
- Scott Allen Harsila
- G01 - MEASURING TESTING
Information Patent Grant
Interchangeable reflective assembly for a chromatic range sensor op...
- Patent number 9,651,764
- Issue date May 16, 2017
- Mitutoyo Corporation
- Scott Allen Harsila
- G02 - OPTICS
Information Patent Grant
Interchangeable chromatic range sensor probe for a coordinate measu...
- Patent number 9,115,982
- Issue date Aug 25, 2015
- Mitutoyo Corporation
- Benjamin Keith Jones
- G01 - MEASURING TESTING
Information Patent Grant
Interchangeable optics configuration for a chromatic range sensor o...
- Patent number 8,817,240
- Issue date Aug 26, 2014
- Mitutoyo Corporation
- Benjamin Keith Jones
- G01 - MEASURING TESTING
Information Patent Grant
Interchangeable chromatic range sensor probe for a coordinate measu...
- Patent number 8,736,817
- Issue date May 27, 2014
- Mitutoyo Corporation
- Benjamin Keith Jones
- G01 - MEASURING TESTING
Information Patent Grant
High intensity point source system for high spectral stability
- Patent number 8,317,347
- Issue date Nov 27, 2012
- Mitutoyo Corporation
- Paul Gerard Gladnick
- G01 - MEASURING TESTING
Information Patent Grant
Phosphor wheel configuration for high intensity point source
- Patent number 8,142,050
- Issue date Mar 27, 2012
- Mitutoyo Corporation
- Casey Edward Emtman
- G01 - MEASURING TESTING
Information Patent Grant
Reference signal generating configuration for an interferometric mi...
- Patent number 7,965,393
- Issue date Jun 21, 2011
- Mitutoyo Corporation
- Avron Zwilling
- G01 - MEASURING TESTING
Information Patent Grant
Focus detection apparatus having extended detection range
- Patent number 7,723,657
- Issue date May 25, 2010
- Mitutoyo Corporation
- Eric Herbert Altendorf
- G01 - MEASURING TESTING
Information Patent Grant
Multi-range non-contact probe
- Patent number 7,508,529
- Issue date Mar 24, 2009
- Mitutoyo Corporation
- Paul Gladnick
- G01 - MEASURING TESTING
Information Patent Grant
Precision measuring gauges with optical fiber output channels
- Patent number 7,211,782
- Issue date May 1, 2007
- Mitutoyo Corporation
- Joseph D. Tobiason
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING PROBE WITH FIELD GENERATING COIL CONFIGURATION AND TEMPER...
- Publication number 20240219163
- Publication date Jul 4, 2024
- MITUTOYO CORPORATION
- Christopher Richard HAMNER
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE WITH SENSING COILS AND TEMPERATURE COMPENSATION
- Publication number 20240219164
- Publication date Jul 4, 2024
- MITUTOYO CORPORATION
- Christopher Richard HAMNER
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE UPDATE RATE FOR MEASURING PROBE
- Publication number 20240077296
- Publication date Mar 7, 2024
- MITUTOYO CORPORATION
- Scott Allen HARSILA
- G01 - MEASURING TESTING
Information Patent Application
SHIELDING FOR SENSOR CONFIGURATION AND ALIGNMENT OF COORDINATE MEAS...
- Publication number 20230194233
- Publication date Jun 22, 2023
- MITUTOYO CORPORATION
- Dawn Alisa KEEHNEL
- G01 - MEASURING TESTING
Information Patent Application
MODULAR CONFIGURATION FOR COORDINATE MEASURING MACHINE PROBE
- Publication number 20230194235
- Publication date Jun 22, 2023
- MITUTOYO CORPORATION
- Dawn Alisa KEEHNEL
- G01 - MEASURING TESTING
Information Patent Application
WORKPIECE HOLDER FOR UTILIZATION IN METROLOGY SYSTEM FOR MEASURING...
- Publication number 20220349705
- Publication date Nov 3, 2022
- MITUTOYO CORPORATION
- Scott Allen Harsila
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE POSITION SENSOR SIGNAL GAIN CONTROL FOR COORDINATE MEASUR...
- Publication number 20220205773
- Publication date Jun 30, 2022
- MITUTOYO CORPORATION
- Christopher Richard HAMNER
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...
- Publication number 20200141717
- Publication date May 7, 2020
- MITUTOYO CORPORATION
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...
- Publication number 20200141714
- Publication date May 7, 2020
- MITUTOYO CORPORATION
- Ted Staton Cook
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASUREMENT PROBE BODY
- Publication number 20190120606
- Publication date Apr 25, 2019
- MITUTOYO CORPORATION
- Scott Allen Harsila
- G01 - MEASURING TESTING
Information Patent Application
MODULATION MONITORING SYSTEM FOR USE WITH AN IMAGING SYSTEM THAT IN...
- Publication number 20180275390
- Publication date Sep 27, 2018
- MITUTOYO CORPORATION
- Scott Allen Harsila
- G02 - OPTICS
Information Patent Application
MEASUREMENT DEVICE WITH MULTIPLEXED POSITION SIGNALS
- Publication number 20170176171
- Publication date Jun 22, 2017
- MITUTOYO CORPORATION
- Scott Allen Harsila
- G01 - MEASURING TESTING
Information Patent Application
INTERCHANGEABLE REFLECTIVE ASSEMBLY FOR A CHROMATIC RANGE SENSOR OP...
- Publication number 20150211850
- Publication date Jul 30, 2015
- MITUTOYO CORPORATION
- Scott Allen Harsila
- G02 - OPTICS
Information Patent Application
Interchangeable Chromatic Range Sensor Probe for a Coordinate Measu...
- Publication number 20140340679
- Publication date Nov 20, 2014
- Mitutoyo Corporation
- Benjamin Keith Jones
- G01 - MEASURING TESTING
Information Patent Application
INTERCHANGEABLE CHROMATIC RANGE SENSOR PROBE FOR A COORDINATE MEASU...
- Publication number 20130314689
- Publication date Nov 28, 2013
- Benjamin Keith Jones
- G01 - MEASURING TESTING
Information Patent Application
INTERCHANGEABLE OPTICS CONFIGURATION FOR A CHROMATIC RANGE SENSOR O...
- Publication number 20130314690
- Publication date Nov 28, 2013
- Mitutoyo Corporation
- Benjamin Keith Jones
- G01 - MEASURING TESTING
Information Patent Application
HIGH INTENSITY POINT SOURCE SYSTEM FOR HIGH SPECTRAL STABILITY
- Publication number 20120162962
- Publication date Jun 28, 2012
- Mitutoyo Corporation
- Paul Gerard Gladnick
- G01 - MEASURING TESTING
Information Patent Application
PHOSPHOR WHEEL CONFIGURATION FOR HIGH INTENSITY POINT SOURCE
- Publication number 20110317171
- Publication date Dec 29, 2011
- Mitutoyo Corporation
- Casey Edward Emtman
- G01 - MEASURING TESTING
Information Patent Application
PHOSPHOR WHEEL CONFIGURATION FOR HIGH INTENSITY POINT SOURCE
- Publication number 20110317396
- Publication date Dec 29, 2011
- Mitutoyo Corporation
- Casey Edward Emtman
- G01 - MEASURING TESTING
Information Patent Application
EXTENDED RANGE FOCUS DETECTION APPARATUS
- Publication number 20090152440
- Publication date Jun 18, 2009
- Mitutoyo Corporation
- Eric Herbert Altendorf
- G02 - OPTICS
Information Patent Application
REFERENCE SIGNAL GENERATING CONFIGURATION FOR AN INTERFEROMETRIC MI...
- Publication number 20090135435
- Publication date May 28, 2009
- Mitutoyo Corporation
- Avron Zwilling
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE SIGNAL GENERATING CONFIGURATION FOR AN INTERFEROMETRIC MI...
- Publication number 20090027692
- Publication date Jan 29, 2009
- Mitutoyo Corporation
- Avron Zwilling
- G01 - MEASURING TESTING
Information Patent Application
Multi-range non-contact probe
- Publication number 20080024753
- Publication date Jan 31, 2008
- Mitutoyo Corporation
- Paul Gladnick
- G01 - MEASURING TESTING
Information Patent Application
Precision measuring gauges with optical fiber output channels
- Publication number 20050224705
- Publication date Oct 13, 2005
- Joseph D. Tobiason
- G02 - OPTICS

Scott Allen Harsila

Person

Patents Grantslast 30 patents

Modular configuration for coordinate measuring machine probe

Shielding for sensor configuration and alignment of coordinate meas...

Inductive position sensor signal gain control for coordinate measur...

Workpiece holder for utilization in metrology system for measuring...

Inductive position detection configuration for indicating a measure...

Inductive position detection configuration for indicating a measure...

Coordinate measurement probe body

Modulation monitoring system for use with an imaging system that in...

Measurement device with multiplexed position signals

Interchangeable reflective assembly for a chromatic range sensor op...

Interchangeable chromatic range sensor probe for a coordinate measu...

Interchangeable optics configuration for a chromatic range sensor o...

Interchangeable chromatic range sensor probe for a coordinate measu...

High intensity point source system for high spectral stability

Phosphor wheel configuration for high intensity point source

Reference signal generating configuration for an interferometric mi...

Focus detection apparatus having extended detection range

Multi-range non-contact probe

Precision measuring gauges with optical fiber output channels

Patents Applicationslast 30 patents

MEASURING PROBE WITH FIELD GENERATING COIL CONFIGURATION AND TEMPER...

MEASURING PROBE WITH SENSING COILS AND TEMPERATURE COMPENSATION

ADJUSTABLE UPDATE RATE FOR MEASURING PROBE

SHIELDING FOR SENSOR CONFIGURATION AND ALIGNMENT OF COORDINATE MEAS...

MODULAR CONFIGURATION FOR COORDINATE MEASURING MACHINE PROBE

WORKPIECE HOLDER FOR UTILIZATION IN METROLOGY SYSTEM FOR MEASURING...

INDUCTIVE POSITION SENSOR SIGNAL GAIN CONTROL FOR COORDINATE MEASUR...

INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...

INDUCTIVE POSITION DETECTION CONFIGURATION FOR INDICATING A MEASURE...

COORDINATE MEASUREMENT PROBE BODY

MODULATION MONITORING SYSTEM FOR USE WITH AN IMAGING SYSTEM THAT IN...

MEASUREMENT DEVICE WITH MULTIPLEXED POSITION SIGNALS

INTERCHANGEABLE REFLECTIVE ASSEMBLY FOR A CHROMATIC RANGE SENSOR OP...

Interchangeable Chromatic Range Sensor Probe for a Coordinate Measu...

INTERCHANGEABLE CHROMATIC RANGE SENSOR PROBE FOR A COORDINATE MEASU...

INTERCHANGEABLE OPTICS CONFIGURATION FOR A CHROMATIC RANGE SENSOR O...

HIGH INTENSITY POINT SOURCE SYSTEM FOR HIGH SPECTRAL STABILITY

PHOSPHOR WHEEL CONFIGURATION FOR HIGH INTENSITY POINT SOURCE

PHOSPHOR WHEEL CONFIGURATION FOR HIGH INTENSITY POINT SOURCE

EXTENDED RANGE FOCUS DETECTION APPARATUS

REFERENCE SIGNAL GENERATING CONFIGURATION FOR AN INTERFEROMETRIC MI...

REFERENCE SIGNAL GENERATING CONFIGURATION FOR AN INTERFEROMETRIC MI...

Multi-range non-contact probe

Precision measuring gauges with optical fiber output channels