Scott Anderson Middlebrooks

Person

Duizel, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 12,112,260
- Issue date Oct 8, 2024
- ASML Netherlands B.V.
- Lorenzo Tripodi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring variation, inspection system, computer program,...
- Patent number 11,966,168
- Issue date Apr 23, 2024
- ASML Netherlands B.V.
- Antoine Gaston Marie Kiers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for obtaining diagnostic information relating...
- Patent number 11,940,740
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for predicting layer deformation
- Patent number 11,880,640
- Issue date Jan 23, 2024
- ASML Netherlands B.V.
- Chrysostomos Batistakis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deep learning for semantic segmentation of pattern
- Patent number 11,847,570
- Issue date Dec 19, 2023
- ASML Netherlands B.V.
- Adrianus Cornelis Matheus Koopman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for image analysis
- Patent number 11,720,029
- Issue date Aug 8, 2023
- ASML NETHERLANDS B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for predicting layer deformation
- Patent number 11,625,520
- Issue date Apr 11, 2023
- ASML Netherlands B.V.
- Chrysostomos Batistakis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection tool, inspection method and computer program product
- Patent number 11,442,368
- Issue date Sep 13, 2022
- ASML Netherlands B.V.
- Richard Quintanilha
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for obtaining diagnostic information relating...
- Patent number 11,385,550
- Issue date Jul 12, 2022
- ASML Netherlands B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deep learning for semantic segmentation of pattern
- Patent number 11,379,970
- Issue date Jul 5, 2022
- ASML Netherlands B.V.
- Adrianus Cornelis Matheus Koopman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for image analysis
- Patent number 11,143,970
- Issue date Oct 12, 2021
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring variation, inspection system, computer program,...
- Patent number 11,131,936
- Issue date Sep 28, 2021
- ASML Netherlands B.V.
- Antoine Gaston Marie Kiers
- G01 - MEASURING TESTING
Information Patent Grant
Yield estimation and control
- Patent number 11,119,414
- Issue date Sep 14, 2021
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for image analysis
- Patent number 11,067,901
- Issue date Jul 20, 2021
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Source separation from metrology data
- Patent number 11,016,397
- Issue date May 25, 2021
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Object identification and comparison
- Patent number 10,890,540
- Issue date Jan 12, 2021
- ASML Netherlands B.V.
- Adrianus Cornelis Matheus Koopman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Displacement based overlay or alignment
- Patent number 10,852,646
- Issue date Dec 1, 2020
- ASML Netherlands B.V.
- Marinus Jochemsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for image analysis
- Patent number 10,732,513
- Issue date Aug 4, 2020
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology method and apparatus, lithographic system and device manu...
- Patent number 10,725,386
- Issue date Jul 28, 2020
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus for obtaining diagnostic information relating...
- Patent number 10,642,162
- Issue date May 5, 2020
- ASML Netherlands B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Yield estimation and control
- Patent number 10,627,723
- Issue date Apr 21, 2020
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for image analysis
- Patent number 10,607,334
- Issue date Mar 31, 2020
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for obtaining diagnostic information, methods...
- Patent number 10,539,882
- Issue date Jan 21, 2020
- ASML Netherlands B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for image analysis
- Patent number 10,437,157
- Issue date Oct 8, 2019
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology method and apparatus, lithographic system and device manu...
- Patent number 10,331,041
- Issue date Jun 25, 2019
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection method and apparatus, and corresponding lithographic app...
- Patent number 10,295,913
- Issue date May 21, 2019
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus for obtaining diagnostic information relating...
- Patent number 10,274,834
- Issue date Apr 30, 2019
- ASML Netherlands B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology method and apparatus, lithographic system and device manu...
- Patent number 10,126,662
- Issue date Nov 13, 2018
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus for obtaining diagnostic information relating...
- Patent number 9,946,165
- Issue date Apr 17, 2018
- ASML Netherlands B.V.
- Alexander Ypma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method and apparatus, lithographic system and device manu...
- Patent number 9,910,366
- Issue date Mar 6, 2018
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
OBTAINING A PARAMETER CHARACTERIZING A FABRICATION PROCESS
- Publication number 20250021020
- Publication date Jan 16, 2025
- ASML NETHERLANDS B.V.
- Patrick Philipp HELFENSTEIN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SOURCE SEPARATION FROM METROLOGY DATA
- Publication number 20250004385
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Marc Johannes NOOT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Metrology Apparatus And Method For Determining A Characteristic Of...
- Publication number 20240412067
- Publication date Dec 12, 2024
- ASML NETHERLANDS B.V.
- Lorenzo Tripodi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING A STOCHASTIC METRIC RELATING TO A LITHOGRAPH...
- Publication number 20240369944
- Publication date Nov 7, 2024
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY TARGET OPTIMIZATION
- Publication number 20240320528
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Patrick Philipp HELFENSTEIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALIGNING A DISTORTED IMAGE
- Publication number 20240233305
- Publication date Jul 11, 2024
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMET...
- Publication number 20240152060
- Publication date May 9, 2024
- ASML NETHERLANDS B.V.
- Patrick Philipp HELFENSTEIN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE DIMENSIONAL DATA BASED O...
- Publication number 20240054669
- Publication date Feb 15, 2024
- ASML NETHERLANDS B.V.
- Tim HOUBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR OBTAINING DIAGNOSTIC INFORMATION RELATING...
- Publication number 20240019788
- Publication date Jan 18, 2024
- ASML NETHERLANDS B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING BASED IMAGE GENERATION OF AFTER-DEVELOPMENT OR AFT...
- Publication number 20240020961
- Publication date Jan 18, 2024
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING LITHOGRAPHIC MATCHING PERFORMANCE
- Publication number 20230341783
- Publication date Oct 26, 2023
- ASML NETHERLANDS B.V.
- Arnaud HUBAUX
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS AND METHOD FOR SELECTING INFORMATIVE PATTERNS FOR TRAININ...
- Publication number 20230267711
- Publication date Aug 24, 2023
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR PREDICTING LAYER DEFORMATION
- Publication number 20230222273
- Publication date Jul 13, 2023
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALIGNING A DISTORTED IMAGE
- Publication number 20230036630
- Publication date Feb 2, 2023
- ASML NETHERLANDS B.V.
- Coen Adrianus VERSCHUREN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REMOVING AN ARTIFACT FROM AN IMAGE
- Publication number 20230021320
- Publication date Jan 26, 2023
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMET...
- Publication number 20230004096
- Publication date Jan 5, 2023
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING PREDICTIVE IMAGES FOR WAFER INSPEC...
- Publication number 20220375063
- Publication date Nov 24, 2022
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INCREASING CERTAINTY IN PARAMETERIZED MODEL PREDICTIONS
- Publication number 20220335290
- Publication date Oct 20, 2022
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR OBTAINING DIAGNOSTIC INFORMATION RELATING...
- Publication number 20220326623
- Publication date Oct 13, 2022
- ASML NETHERLANDS B.V.
- Alexander Ypma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEEP LEARNING FOR SEMANTIC SEGMENTATION OF PATTERN
- Publication number 20220327686
- Publication date Oct 13, 2022
- ASML NETHERLANDS B.V.
- Adrianus Cornelis Matheus KOOPMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR PREDICTING SUBSTRATE IMAGE
- Publication number 20220187713
- Publication date Jun 16, 2022
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR IMAGE ANALYSIS
- Publication number 20220026811
- Publication date Jan 27, 2022
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MEASURING VARIATION, INSPECTION SYSTEM, COMPUTER PROGRAM,...
- Publication number 20220011680
- Publication date Jan 13, 2022
- ASML NETHERLANDS B.V.
- Antoine Gaston Marie KIERS
- G01 - MEASURING TESTING
Information Patent Application
YIELD ESTIMATION AND CONTROL
- Publication number 20210405545
- Publication date Dec 30, 2021
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEEP LEARNING FOR SEMANTIC SEGMENTATION OF PATTERN
- Publication number 20210374936
- Publication date Dec 2, 2021
- ASML NETHERLANDS B.V.
- Adrianus Cornelis Matheus KOOPMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DECREASING UNCERTAINTY IN MACHINE LEARNING MODEL PREDICT...
- Publication number 20210286270
- Publication date Sep 16, 2021
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION TOOL, INSPECTION METHOD AND COMPUTER PROGRAM PRODUCT
- Publication number 20210232052
- Publication date Jul 29, 2021
- ASML NETHERLANDS B.V.
- Richard QUINTANILHA
- G01 - MEASURING TESTING
Information Patent Application
HIDDEN DEFECT DETECTION AND EPE ESTIMATION BASED ON THE EXTRACTED 3...
- Publication number 20210174491
- Publication date Jun 10, 2021
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR IMAGE ANALYSIS
- Publication number 20200356009
- Publication date Nov 12, 2020
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR PREDICTING LAYER DEFORMATION
- Publication number 20200320238
- Publication date Oct 8, 2020
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING

Scott Anderson Middlebrooks

Person

Patents Grantslast 30 patents

Metrology apparatus and method for determining a characteristic of...

Method of measuring variation, inspection system, computer program,...

Methods and apparatus for obtaining diagnostic information relating...

Systems and methods for predicting layer deformation

Deep learning for semantic segmentation of pattern

Method and apparatus for image analysis

Systems and methods for predicting layer deformation

Inspection tool, inspection method and computer program product

Methods and apparatus for obtaining diagnostic information relating...

Deep learning for semantic segmentation of pattern

Method and apparatus for image analysis

Method of measuring variation, inspection system, computer program,...

Yield estimation and control

Method and apparatus for image analysis

Source separation from metrology data

Object identification and comparison

Displacement based overlay or alignment

Method and apparatus for image analysis

Metrology method and apparatus, lithographic system and device manu...

Methods and apparatus for obtaining diagnostic information relating...

Yield estimation and control

Method and apparatus for image analysis

Methods and apparatus for obtaining diagnostic information, methods...

Method and apparatus for image analysis

Metrology method and apparatus, lithographic system and device manu...

Inspection method and apparatus, and corresponding lithographic app...

Methods and apparatus for obtaining diagnostic information relating...

Metrology method and apparatus, lithographic system and device manu...

Methods and apparatus for obtaining diagnostic information relating...

Metrology method and apparatus, lithographic system and device manu...

Patents Applicationslast 30 patents

OBTAINING A PARAMETER CHARACTERIZING A FABRICATION PROCESS

SOURCE SEPARATION FROM METROLOGY DATA

Metrology Apparatus And Method For Determining A Characteristic Of...

METHOD FOR DETERMINING A STOCHASTIC METRIC RELATING TO A LITHOGRAPH...

METROLOGY TARGET OPTIMIZATION

ALIGNING A DISTORTED IMAGE

METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMET...

APPARATUS AND METHOD FOR DETERMINING THREE DIMENSIONAL DATA BASED O...

METHODS AND APPARATUS FOR OBTAINING DIAGNOSTIC INFORMATION RELATING...

MACHINE LEARNING BASED IMAGE GENERATION OF AFTER-DEVELOPMENT OR AFT...

DETERMINING LITHOGRAPHIC MATCHING PERFORMANCE

APPARATUS AND METHOD FOR SELECTING INFORMATIVE PATTERNS FOR TRAININ...

SYSTEMS AND METHODS FOR PREDICTING LAYER DEFORMATION

ALIGNING A DISTORTED IMAGE

REMOVING AN ARTIFACT FROM AN IMAGE

METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMET...

SYSTEM AND METHOD FOR GENERATING PREDICTIVE IMAGES FOR WAFER INSPEC...

METHOD FOR INCREASING CERTAINTY IN PARAMETERIZED MODEL PREDICTIONS

METHODS AND APPARATUS FOR OBTAINING DIAGNOSTIC INFORMATION RELATING...

DEEP LEARNING FOR SEMANTIC SEGMENTATION OF PATTERN

METHOD AND APPARATUS FOR PREDICTING SUBSTRATE IMAGE

METHOD AND APPARATUS FOR IMAGE ANALYSIS

METHOD OF MEASURING VARIATION, INSPECTION SYSTEM, COMPUTER PROGRAM,...

YIELD ESTIMATION AND CONTROL

DEEP LEARNING FOR SEMANTIC SEGMENTATION OF PATTERN

METHOD FOR DECREASING UNCERTAINTY IN MACHINE LEARNING MODEL PREDICT...

INSPECTION TOOL, INSPECTION METHOD AND COMPUTER PROGRAM PRODUCT

HIDDEN DEFECT DETECTION AND EPE ESTIMATION BASED ON THE EXTRACTED 3...

METHOD AND APPARATUS FOR IMAGE ANALYSIS

SYSTEMS AND METHODS FOR PREDICTING LAYER DEFORMATION