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Scott Bushman
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Richardson, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methodology of implementing ultra high temperature (UHT) anneal in...
Patent number
7,700,467
Issue date
Apr 20, 2010
Texas Instruments Incorporated
Haowen Bu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Run-to-run control method for automated control of metal deposition...
Patent number
7,324,865
Issue date
Jan 29, 2008
Advanced Micro Devices, Inc.
Thomas Sonderman
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method and apparatus for controlling wafer thickness uniformity in...
Patent number
6,850,322
Issue date
Feb 1, 2005
Advanced Micro Devices, Inc.
William Jarrett Campbell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Control of two-step gate etch process
Patent number
6,734,088
Issue date
May 11, 2004
Advanced Micro Devices, Inc.
Matthew Purdy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for controlling focus based on a thickness of...
Patent number
6,709,797
Issue date
Mar 23, 2004
Advanced Micro Devices, Inc.
Scott Bushman
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for adjusting incoming film thickness uniformity such that v...
Patent number
6,546,306
Issue date
Apr 8, 2003
Advanced Micro Devices, Inc.
Scott Bushman
B24 - GRINDING POLISHING
Information
Patent Grant
Method and apparatus for the integration of sensor data from a proc...
Patent number
6,535,783
Issue date
Mar 18, 2003
Advanced Micro Devices, Inc.
Michael Lee Miller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for controlling optical-parameters in a stepper
Patent number
6,417,912
Issue date
Jul 9, 2002
Advanced Micro Devices, Inc.
Scott Bushman
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
METHODOLOGY OF IMPLEMENTING ULTRA HIGH TEMPERATURE (UHT) ANNEAL IN...
Publication number
20090098665
Publication date
Apr 16, 2009
Haowen BU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROCESS METHOD TO FABRICATE CMOS CIRCUITS WITH DUAL STRESS CONTACT...
Publication number
20090020791
Publication date
Jan 22, 2009
Shaofeng Yu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and system for qualifying a semiconductor etch process
Publication number
20060186406
Publication date
Aug 24, 2006
Texas Instruments Inc.
Scott Gregory Bushman
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for controlling a thickness of a copper film
Publication number
20020192944
Publication date
Dec 19, 2002
Thomas J. Sonderman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for controlling wafer thickness uniformity in...
Publication number
20020085212
Publication date
Jul 4, 2002
William Jarrett Campbell
H01 - BASIC ELECTRIC ELEMENTS