Scott Hanson

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Norwood, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test probe assembly and related methods
- Patent number 9,829,506
- Issue date Nov 28, 2017
- Xcerra Corporation
- Valts Treibergs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION
- Publication number 20200116759
- Publication date Apr 16, 2020
- XCERRA CORPORATION
- Jason Mroczkowski
- G01 - MEASURING TESTING
Information Patent Application
TEST PROBE ASSEMBLY AND RELATED METHODS
- Publication number 20150070040
- Publication date Mar 12, 2015
- XCERRA CORPORATION
- Valts Treibergs
- G01 - MEASURING TESTING