Scott Jansen

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East Fishkill, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Stress-inducing structures, methods, and materials
- Patent number 9,373,717
- Issue date Jun 21, 2016
- Infineon Technologies AG
- Alois Gutmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stress-inducing structures, methods, and materials
- Patent number 8,907,444
- Issue date Dec 9, 2014
- Infineon Technologies AG
- Alois Gutmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stress-inducing structures, methods, and materials
- Patent number 8,361,879
- Issue date Jan 29, 2013
- Infineon Technologies AG
- Alois Gutmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated test structures for electron beam inspecti...
- Patent number 7,679,083
- Issue date Mar 16, 2010
- Samsung Electronics Co., Ltd.
- Min Chul Sun
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Stress-inducing Structures, Methods, and Materials
- Publication number 20150137253
- Publication date May 21, 2015
- INFINEON TECHNOLOGIES AG
- Alois Gutmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Stress-Inducing Structures, Methods, and Materials
- Publication number 20130134420
- Publication date May 30, 2013
- INFINEON TECHNOLOGIES AG
- Alois Gutmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Stress-Inducing Structures, Methods, and Materials
- Publication number 20090283852
- Publication date Nov 19, 2009
- Alois Gutmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Integrated Test Structures For Electron Beam Inspecti...
- Publication number 20080237586
- Publication date Oct 2, 2008
- Min Chul Sun
- H01 - BASIC ELECTRIC ELEMENTS