Scott Joseph Jewler

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for detecting defects in devices using X-rays
- Patent number 11,688,067
- Issue date Jun 27, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for printed circuit board design based on autom...
- Patent number 11,662,479
- Issue date May 30, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for manufacturing printed circuit board based o...
- Patent number 11,651,492
- Issue date May 16, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for product failure prediction based on X-ray i...
- Patent number 11,615,533
- Issue date Mar 28, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for process control based on X-ray inspection
- Patent number 11,430,118
- Issue date Aug 30, 2022
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for printed circuit board design based on autom...
- Patent number 11,042,981
- Issue date Jun 22, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and Systems for Printed Circuit Board Design Based on Autom...
- Publication number 20210279878
- Publication date Sep 9, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Manufacturing Printed Circuit Board based o...
- Publication number 20210014979
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Methods and Systems for Printed Circuit Board Design Based on Autom...
- Publication number 20210012054
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Product Failure Prediction based on X-ray I...
- Publication number 20210010954
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Detecting Defects in Devices Using X-rays
- Publication number 20210012499
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Process Control Based on X-ray Inspection
- Publication number 20210011177
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING