Scott Ketterer

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Hillsboro, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Mark extension for analysis of long record length data
- Patent number 8,223,151
- Issue date Jul 17, 2012
- Tektronix, Inc.
- Keith D. Rule
- G01 - MEASURING TESTING
Information Patent Grant
Simple integrated control for zoom/pan functions
- Patent number 7,847,792
- Issue date Dec 7, 2010
- Tektronix, Inc.
- Scott R. Ketterer
- G01 - MEASURING TESTING
Information Patent Grant
User-placed marks in a long record length waveform
- Patent number 7,516,028
- Issue date Apr 7, 2009
- Tektronix, Inc.
- Keith D. Rule
- G01 - MEASURING TESTING
Information Patent Grant
Hand-held probing adapter for a measurement probing system
- Patent number 7,017,435
- Issue date Mar 28, 2006
- Tektronix, Inc.
- William R. Pooley
- G01 - MEASURING TESTING
Information Patent Grant
Electronic test and measurement instrument
- Patent number D413823
- Issue date Sep 14, 1999
- Tektronix, Inc.
- Kenneth P. Dobyns
- D10 - Measuring, testing, or signalling instruments

Patents Applicationslast 30 patents

Information Patent Application
MARK EXTENSION FOR ANALYSIS OF LONG RECORD LENGTH DATA
- Publication number 20090192740
- Publication date Jul 30, 2009
- Tektronix, Inc.
- Keith D. RULE
- G01 - MEASURING TESTING
Information Patent Application
Simple integrated control for zoom/pan functions
- Publication number 20070035658
- Publication date Feb 15, 2007
- Scott R. Ketterer
- G01 - MEASURING TESTING
Information Patent Application
User-placed marks in a long record length waveform
- Publication number 20070038397
- Publication date Feb 15, 2007
- Keith D. Rule
- G01 - MEASURING TESTING
Information Patent Application
Hand-held probing adapter for a measurement probing system
- Publication number 20050262953
- Publication date Dec 1, 2005
- William R. Pooley
- G01 - MEASURING TESTING