Scott L. Hoagland

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Boise, ID, US

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Patents Grantslast 30 patents

Information Patent Grant
Interfaces having a plurality of connector assemblies
- Patent number 8,749,261
- Issue date Jun 10, 2014
- Micron Technology, Inc.
- Scott Hoagland
- G01 - MEASURING TESTING
Information Patent Grant
Resilient contact probes
- Patent number 7,570,069
- Issue date Aug 4, 2009
- Micron Technology, Inc.
- Daniel P. Cram
- G01 - MEASURING TESTING
Information Patent Grant
Resilient contact probe apparatus
- Patent number 7,427,869
- Issue date Sep 23, 2008
- Micron Technology, Inc.
- Daniel P. Cram
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFACE
- Publication number 20120206159
- Publication date Aug 16, 2012
- Micron Technology, Inc.
- Scott Hoagland
- G01 - MEASURING TESTING
Information Patent Application
Resilient contact probe apparatus
- Publication number 20060261828
- Publication date Nov 23, 2006
- Daniel P. Cram
- G01 - MEASURING TESTING
Information Patent Application
Methods of making a resilient contact apparatus and resilient conta...
- Publication number 20060250151
- Publication date Nov 9, 2006
- Daniel P. Cram
- G01 - MEASURING TESTING
Information Patent Application
Methods of making a resilient contact apparatus and resilient conta...
- Publication number 20060043988
- Publication date Mar 2, 2006
- Daniel P. Cram
- G01 - MEASURING TESTING
Information Patent Application
Resilient contact probe apparatus, methods of using and making, and...
- Publication number 20050253602
- Publication date Nov 17, 2005
- Daniel P. Cram
- G01 - MEASURING TESTING