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Shanghai, CN
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last 30 patents
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Patent Grant
Method for treatment of samples for auger electronic spectrometer (...
Patent number
7,927,893
Issue date
Apr 19, 2011
Semiconductor Manufacturing International (Shanghai) Corporation
Qi Hau Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Method for treatment of samples for auger electronic spectrometer (...
Patent number
7,504,269
Issue date
Mar 17, 2009
Semiconductor Manufacturing International (Shanghai) Corporation
Qi Hau Zhang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
APPARATUS FOR TREATMENT OF SAMPLES FOR AUGER ELECTRONIC SPECTROMETE...
Publication number
20110168554
Publication date
Jul 14, 2011
Semiconductor Manufacturing International (Shanghai) Corporation
QI HAU ZHANG
G01 - MEASURING TESTING
Information
Patent Application
Method for Treatment of Samples for Auger Electronic Spectrometer (...
Publication number
20090305440
Publication date
Dec 10, 2009
Semiconductor Manufacturing International (Shanghai) Corporation
Qi Hau Zhang
G01 - MEASURING TESTING
Information
Patent Application
Method for treatment of samples for auger electronic spectrometer (...
Publication number
20070148790
Publication date
Jun 28, 2007
Semiconductor Manufacturing International (Shanghai) Corporation
Qi Hau Zhang
G01 - MEASURING TESTING