Scott Olszewski

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of controlling process parameters for semiconductor manufact...
- Patent number 7,848,840
- Issue date Dec 7, 2010
- Applied Materials, Inc.
- Ritchie Dao
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS OF A SUBSTRATE ETCHING SYSTEM AND PROCESS
- Publication number 20090272717
- Publication date Nov 5, 2009
- Applied Materials, Inc.
- Sharma V. Pamarthy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CONTROLLING PROCESS PARAMETERS FOR SEMICONDUCTOR MANUFACT...
- Publication number 20090177310
- Publication date Jul 9, 2009
- Ritchie Dao
- G05 - CONTROLLING REGULATING