Scott P. Lockledge

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West Chester, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe and electron microscope probes and their manufacture
- Patent number 11,237,188
- Issue date Feb 1, 2022
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe and electron microscope probes and their manufacture
- Patent number 11,169,177
- Issue date Nov 9, 2021
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe and electron microscope probes and their manufacture
- Patent number 10,060,948
- Issue date Aug 28, 2018
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning Probe and Electron Microscope Probes and Their Manufacture
- Publication number 20220128595
- Publication date Apr 28, 2022
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe and Electron Microscope Probes and Their Manufacture
- Publication number 20190219611
- Publication date Jul 18, 2019
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe and Electron Microscope Probes and Their Manufacture
- Publication number 20180328960
- Publication date Nov 15, 2018
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe and Electron Microscope Probes and Their Manufacture
- Publication number 20180045755
- Publication date Feb 15, 2018
- Tiptek, LLC
- Joseph W. Lyding
- G01 - MEASURING TESTING