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Scott R. Grange
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Pleasant Grove, UT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Electrical safety device miswire detection
Patent number
10,141,734
Issue date
Nov 27, 2018
Semiconductor Components Industries, LLC
Riley D. Beck
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Single wound current transformer impedance measurement circuit
Patent number
9,897,636
Issue date
Feb 20, 2018
Semiconductor Components Industries, LLC
Riley D. Beck
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Ground fault circuit interrupter and method
Patent number
9,645,192
Issue date
May 9, 2017
Semiconductor Components Industries, LLC
Riley D. Beck
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Ground fault circuit interrupter and method
Patent number
9,478,969
Issue date
Oct 25, 2016
Semiconductor Components Industries, LLC
Riley D. Beck
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Impedance measuring circuit
Patent number
9,329,216
Issue date
May 3, 2016
Semiconductor Components Industries, LLC
Riley D. Beck
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Method for determining a circuit element parameter
Patent number
9,330,875
Issue date
May 3, 2016
Semiconductor Components Industries, LLC
Riley D. Beck
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Ground fault circuit interrupter and method
Patent number
8,390,297
Issue date
Mar 5, 2013
Semiconductor Components Industries, LLC
Riley D. Beck
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Patents Applications
last 30 patents
Information
Patent Application
SINGLE WOUND CURRENT TRANSFORMER IMPEDANCE MEASUREMENT CIRCUIT
Publication number
20160238644
Publication date
Aug 18, 2016
Semiconductor Components Industries, LLC
Riley D. Beck
G01 - MEASURING TESTING
Information
Patent Application
GROUND FAULT CIRCUIT INTERRUPTER AND METHOD
Publication number
20160233837
Publication date
Aug 11, 2016
Semiconductor Components Industries, LLC
Riley D. Beck
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICAL SAFETY DEVICE MISWIRE DETECTION
Publication number
20160118785
Publication date
Apr 28, 2016
Semiconductor Components Industries, LLC
Riley D. BECK
G01 - MEASURING TESTING
Information
Patent Application
GROUND FAULT CIRCUIT INTERRUPTER AND METHOD
Publication number
20140266272
Publication date
Sep 18, 2014
Semiconductor Components Industries, LLC
Riley D. Beck
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETERMINING A CIRCUIT ELEMENT PARAMETER
Publication number
20140210484
Publication date
Jul 31, 2014
Riley D. Beck
G01 - MEASURING TESTING
Information
Patent Application
GROUND FAULT CIRCUIT INTERRUPTER AND METHOD
Publication number
20130229734
Publication date
Sep 5, 2013
Semicomductor Components Industries, LLC
Riley D. Beck
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
IMPEDANCE MEASURING CIRCUIT
Publication number
20130214800
Publication date
Aug 22, 2013
Riley D. Beck
G01 - MEASURING TESTING
Information
Patent Application
GROUND FAULT CIRCUIT INTERRUPTER AND METHOD
Publication number
20110080177
Publication date
Apr 7, 2011
Riley D. Beck
G01 - MEASURING TESTING