Scott R. Jansen

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Beaverton, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Signal acquisition system having reduced probe loading of a device...
- Patent number 8,723,530
- Issue date May 13, 2014
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having reduced probe loading of a device...
- Patent number 8,564,308
- Issue date Oct 22, 2013
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having reduced probe loading of a device...
- Patent number 8,436,624
- Issue date May 7, 2013
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having a compensation digital filter
- Patent number 8,278,940
- Issue date Oct 2, 2012
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Optical connector with direct mounted photo diode
- Patent number 4,818,056
- Issue date Apr 4, 1989
- Tektronix, Inc.
- R. Scott Enochs
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SIGNAL ACQUISITION SYSTEM HAVING REDUCED PROBE LOADING OF A DEVICE...
- Publication number 20130221985
- Publication date Aug 29, 2013
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having a Compensation Digital Filter
- Publication number 20110074391
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Low Capacitance Signal Acquisition System
- Publication number 20110074441
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having Reduced Probe Loading of a Device...
- Publication number 20110074392
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having Reduced Probe Loading of a Device...
- Publication number 20110074390
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING