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Scott R. Williams
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St. George, UT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Cantilever probe structure for a probe card assembly
Patent number
8,004,299
Issue date
Aug 23, 2011
SV Probe Pte. Ltd.
Scott R. Williams
G01 - MEASURING TESTING
Information
Patent Grant
Probe card with stacked substrate
Patent number
7,898,276
Issue date
Mar 1, 2011
SV Probe Pte. Ltd.
Scott R. Williams
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CANTILEVER PROBE STRUCTURE FOR A PROBE CARD ASSEMBLY
Publication number
20110148449
Publication date
Jun 23, 2011
Scott R. Williams
G01 - MEASURING TESTING
Information
Patent Application
Probe Card With Stacked Substrate
Publication number
20080246501
Publication date
Oct 9, 2008
Scott R. Williams
G01 - MEASURING TESTING
Information
Patent Application
Cantilever probe structure for a probe card assembly
Publication number
20070089551
Publication date
Apr 26, 2007
SV Probe Ptd. Ltd.
Scott R. Williams
G01 - MEASURING TESTING