Scott R. Williams

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Saint George, UT, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe card with segmented substrate
- Patent number 8,058,889
- Issue date Nov 15, 2011
- SV Probe Pte. Ltd.
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Stacked tip cantilever electrical connector
- Patent number 7,279,917
- Issue date Oct 9, 2007
- SV Probe Pte. Ltd.
- Scott R. Williams
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe card with segmented substrate
- Publication number 20090212795
- Publication date Aug 27, 2009
- Scott R. Williams
- G01 - MEASURING TESTING
Information Patent Application
Stacked tip cantilever electrical connector
- Publication number 20060043995
- Publication date Mar 2, 2006
- K&S Interconnect, Inc.
- Scott R. Williams
- G01 - MEASURING TESTING