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Scott Seyfried
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Rochester, NY, US
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last 30 patents
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Patent Grant
Characterization of a model-based spectral reflectance sensing device
Patent number
8,340,937
Issue date
Dec 25, 2012
Xerox Corporation
Gary Walker Skinner
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Image Capturing Devices and Associated Methods
Publication number
20210025834
Publication date
Jan 28, 2021
Laser Products Industries, Inc.
Erik Louis
G01 - MEASURING TESTING
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Patent Application
CHARACTERIZATION OF A MODEL-BASED SPECTRAL REFLECTANCE SENSING DEVICE
Publication number
20110282613
Publication date
Nov 17, 2011
Xerox Corporation
Gary Walker Skinner
G01 - MEASURING TESTING