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Scott T. Smith
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Winter Springs, FL, US
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Patents Grants
last 30 patents
Information
Patent Grant
Density detection using real time discrete photon counting for fast...
Patent number
7,408,160
Issue date
Aug 5, 2008
Science Applications International Corporation
Victor V. Verbinski
G01 - MEASURING TESTING
Information
Patent Grant
Density detection using real time discrete photon counting for fast...
Patent number
7,368,717
Issue date
May 6, 2008
Science Applications International Corporation
Victor V. Verbinski
G01 - MEASURING TESTING
Information
Patent Grant
Density detection using real time discrete photon counting for fast...
Patent number
7,365,332
Issue date
Apr 29, 2008
Science Applications International Corporation
Victor V. Verbinski
G01 - MEASURING TESTING
Information
Patent Grant
Measuring linear separations in digital radiographs
Patent number
7,260,255
Issue date
Aug 21, 2007
Science Applications International Corporation
Raulf M. Polichar
G01 - MEASURING TESTING
Information
Patent Grant
Line selected F2 two chamber laser system
Patent number
7,058,107
Issue date
Jun 6, 2006
Cymer, Inc.
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Grant
Density detection using real time discrete photon counting for fast...
Patent number
7,045,787
Issue date
May 16, 2006
Science Applications International Corporation
Victor Verbinski
G01 - MEASURING TESTING
Information
Patent Grant
Very narrow band, two chamber, high reprate gas discharge laser system
Patent number
6,985,508
Issue date
Jan 10, 2006
Cymer, Inc.
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Grant
Four KHz gas discharge laser system
Patent number
6,882,674
Issue date
Apr 19, 2005
Cymer, Inc.
Christian J. Wittak
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Line selected F2 two chamber laser system
Patent number
6,801,560
Issue date
Oct 5, 2004
Cymer, Inc.
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Grant
Four KHz gas discharge laser
Patent number
6,757,316
Issue date
Jun 29, 2004
Cymer, Inc.
Peter C. Newman
G01 - MEASURING TESTING
Information
Patent Grant
Line narrowed laser with bidirection beam expansion
Patent number
6,738,410
Issue date
May 18, 2004
Cymer, Inc.
William N. Partlo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High resolution spectral measurement device
Patent number
6,713,770
Issue date
Mar 30, 2004
Cymer, Inc.
Richard L. Sandstrom
G01 - MEASURING TESTING
Information
Patent Grant
Very narrow band, two chamber, high rep rate gas discharge laser sy...
Patent number
6,625,191
Issue date
Sep 23, 2003
Cymer, Inc.
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Grant
Density detection using discrete photon counting
Patent number
6,552,346
Issue date
Apr 22, 2003
Science Applications International Corporation
Victor V. Verbinski
G01 - MEASURING TESTING
Information
Patent Grant
Gas discharge laser with pulse multiplier
Patent number
6,535,531
Issue date
Mar 18, 2003
Cymer, Inc.
Scott T. Smith
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High resolution etalon-grating monochromator
Patent number
6,480,275
Issue date
Nov 12, 2002
Cymer, Inc.
Richard L. Sandstrom
G01 - MEASURING TESTING
Information
Patent Grant
Double pass double etalon spectrometer
Patent number
6,359,693
Issue date
Mar 19, 2002
Cymer, Inc.
Scott T. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Deep ultraviolet catadioptric anamorphic telescope
Patent number
6,356,576
Issue date
Mar 12, 2002
Cymer, Inc.
Scott T. Smith
G02 - OPTICS
Information
Patent Grant
Density detection using discrete photon counting
Patent number
6,255,654
Issue date
Jul 3, 2001
Science Applications International Corporation
Victor V. Verbinski
G01 - MEASURING TESTING
Information
Patent Grant
Pixel-correlated, digital X-ray imaging system
Patent number
6,205,199
Issue date
Mar 20, 2001
Science Applications International Corporation
Raulf M. Polichar
G02 - OPTICS
Information
Patent Grant
Portable, digital X-ray apparatus for producing, storing and displa...
Patent number
5,909,478
Issue date
Jun 1, 1999
Science Applications International Corporation
Raulf M. Polichar
G01 - MEASURING TESTING
Information
Patent Grant
Portable, digital X-ray apparatus for producing, storing, and displ...
Patent number
5,828,726
Issue date
Oct 27, 1998
Science Applications International Corp.
Raulf M. Polichar
G01 - MEASURING TESTING
Information
Patent Grant
Portable, digital X-ray apparatus for producing, storing, and displ...
Patent number
5,608,774
Issue date
Mar 4, 1997
Science Applications International Corporation
Raulf M. Polichar
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Measuring Linear Separations in Digital Radiographs
Publication number
20080144912
Publication date
Jun 19, 2008
Science Applications International Corporation
Raulf M. Polichar
G01 - MEASURING TESTING
Information
Patent Application
Density detection using real time discrete photon counting for fast...
Publication number
20060145079
Publication date
Jul 6, 2006
SCIENCE APPLICATIONS INTERNATIONAL CORPORATION
Victor V. Verbinski
G01 - MEASURING TESTING
Information
Patent Application
Density detection using real time discrete photon counting for fast...
Publication number
20060145080
Publication date
Jul 6, 2006
SCIENCE APPLICATIONS INTERNATIONAL CORPORATION
Victor V. Verbinski
G01 - MEASURING TESTING
Information
Patent Application
Very narrow band, two chamber, high rep-rate gas discharge laser sy...
Publication number
20060126697
Publication date
Jun 15, 2006
Cymer, Inc.
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Application
Measuring linear separations in digital radiographs
Publication number
20050135668
Publication date
Jun 23, 2005
Science Applications International Corporation
Raulf M. Polichar
G01 - MEASURING TESTING
Information
Patent Application
Density detection using real time discrete photon counting for fast...
Publication number
20040251415
Publication date
Dec 16, 2004
Victor V. Verbinski
G01 - MEASURING TESTING
Information
Patent Application
Line selected F2 two chamber laser system
Publication number
20040174919
Publication date
Sep 9, 2004
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Application
Very narrow band, two chamber, high reprate gas discharge laser system
Publication number
20040047385
Publication date
Mar 11, 2004
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Application
Four KHz gas discharge laser system
Publication number
20030118072
Publication date
Jun 26, 2003
Christian J. Wittak
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Very narrow band, two chamber, high rep rate gas discharge laser sy...
Publication number
20020154668
Publication date
Oct 24, 2002
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Application
Line selected F2 two chamber laser system
Publication number
20020154671
Publication date
Oct 24, 2002
David S. Knowles
G01 - MEASURING TESTING
Information
Patent Application
Large diffraction grating for gas discharge laser
Publication number
20020127497
Publication date
Sep 12, 2002
Daniel J. W. Brown
G02 - OPTICS
Information
Patent Application
High resolution spectral measurement device
Publication number
20020121608
Publication date
Sep 5, 2002
Richard L. Sandstrom
G01 - MEASURING TESTING
Information
Patent Application
High resolution etalon-grating monochromator
Publication number
20020101588
Publication date
Aug 1, 2002
Richard L. Sandstrom
G01 - MEASURING TESTING
Information
Patent Application
Four KHz gas discharge laser
Publication number
20020021728
Publication date
Feb 21, 2002
Peter C. Newman
G01 - MEASURING TESTING
Information
Patent Application
Density detection using discrete photon counting
Publication number
20010020682
Publication date
Sep 13, 2001
Victor V. Verbinski
G01 - MEASURING TESTING
Information
Patent Application
Line narrowed laser with bidirection beam expansion
Publication number
20010014110
Publication date
Aug 16, 2001
William N. Partlo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Double pass double etalon spectrometer
Publication number
20010013933
Publication date
Aug 16, 2001
Scott T. Smith
G01 - MEASURING TESTING