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Scott W. Indermuehle
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Danville, CA, US
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Patents Grants
last 30 patents
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Patent Grant
High-voltage energy-dispersive spectroscopy using a low-voltage sca...
Patent number
9,099,276
Issue date
Aug 4, 2015
Keysight Technologies, Inc.
Lawrence P. Muray
G01 - MEASURING TESTING
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Patent Grant
Layered scanning charged particle microscope package for a charged...
Patent number
8,110,801
Issue date
Feb 7, 2012
Agilent Technologies, Inc.
Scott W. Indermuehle
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
HIGH-VOLTAGE ENERGY-DISPERSIVE SPECTROSCOPY USING A LOW-VOLTAGE SCA...
Publication number
20150213995
Publication date
Jul 30, 2015
Keysight Technologies, Inc.
Lawrence P. Muray
G01 - MEASURING TESTING
Information
Patent Application
LAYERED SCANNING CHARGED PARTICLE MICROSCOPE PACKAGE FOR A CHARGED...
Publication number
20100224779
Publication date
Sep 9, 2010
Scott W. Indermuehle
H01 - BASIC ELECTRIC ELEMENTS