Scott Young

Person

Soquel, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
3D structure inspection or metrology using deep learning
- Patent number 11,644,756
- Issue date May 9, 2023
- KLA Corp.
- Scott A. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accelerated training of a machine learning based model for semicond...
- Patent number 11,580,375
- Issue date Feb 14, 2023
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for focus adjustment of a multi-beam scanning ele...
- Patent number 10,861,671
- Issue date Dec 8, 2020
- KLA Corporation
- Doug K. Masnaghetti
- G02 - OPTICS
Information Patent Grant
Learning based approach for aligning images acquired with different...
- Patent number 10,733,744
- Issue date Aug 4, 2020
- KLA-Tencor Corp.
- Thanh Huy Ha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods for combined brightfield, darkfield, and phot...
- Patent number 10,533,954
- Issue date Jan 14, 2020
- KLA-Tencor Corporation
- Lena Nicolaides
- G01 - MEASURING TESTING
Information Patent Grant
Data augmentation for convolutional neural network-based defect ins...
- Patent number 10,402,688
- Issue date Sep 3, 2019
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accelerating semiconductor-related computations using learning base...
- Patent number 10,360,477
- Issue date Jul 23, 2019
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for focus adjustment of a multi-beam scanning ele...
- Patent number 10,325,753
- Issue date Jun 18, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for focus adjustment of a multi-beam scanning ele...
- Patent number 10,186,396
- Issue date Jan 22, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stereo extended depth of focus
- Patent number 9,961,326
- Issue date May 1, 2018
- KLA-Tencor Corporation
- Scott Young
- G02 - OPTICS
Information Patent Grant
Hybrid inspectors
- Patent number 9,916,965
- Issue date Mar 13, 2018
- KLA-Tencor Corp.
- Kris Bhaskar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for combined brightfield, darkfield, and phot...
- Patent number 9,772,297
- Issue date Sep 26, 2017
- KLA-Tencor Corporation
- Lena Nicolaides
- G01 - MEASURING TESTING
Information Patent Grant
Combined semiconductor metrology system
- Patent number 9,553,034
- Issue date Jan 24, 2017
- KLA-Tencor Corporation
- Scott A. Young
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dark field inspection system with ring illumination
- Patent number 9,176,072
- Issue date Nov 3, 2015
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Inspection site preparation
- Patent number 9,165,742
- Issue date Oct 20, 2015
- KLA-Tencor Corporation
- Richard Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Digital pathology system
- Patent number 9,041,930
- Issue date May 26, 2015
- KLA-Tencor Corporation
- Scott Young
- G01 - MEASURING TESTING
Information Patent Grant
Active planar autofocus
- Patent number 8,643,835
- Issue date Feb 4, 2014
- KLA-Tencor Corporation
- Scott A. Young
- G01 - MEASURING TESTING
Information Patent Grant
Solar metrology methods and apparatus
- Patent number 8,604,447
- Issue date Dec 10, 2013
- KLA-Tencor Corporation
- Scott Young
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and system for hierarchical tissue analysis and classification
- Patent number 8,600,143
- Issue date Dec 3, 2013
- KLA-Tencor Corporation
- Ashok V. Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Confocal wafer inspection system and method
- Patent number 7,858,911
- Issue date Dec 28, 2010
- KLA-Tencor Corporation
- Christopher R. Fairley
- G01 - MEASURING TESTING
Information Patent Grant
Confocal wafer inspection method and apparatus using fly lens arran...
- Patent number 7,399,950
- Issue date Jul 15, 2008
- KLA-Tencor Corporation
- Christopher R. Fairley
- G01 - MEASURING TESTING
Information Patent Grant
Confocal wafer depth scanning inspection method
- Patent number 7,109,458
- Issue date Sep 19, 2006
- KLA-Tencor Corporation
- Christopher R. Fairley
- G01 - MEASURING TESTING
Information Patent Grant
Reuse in semiconductor measurement recipes
- Patent number 7,047,101
- Issue date May 16, 2006
- KLA-Tencor Technologies Corporation
- Scott Young
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Confocal wafer inspection method and apparatus using fly lens arran...
- Patent number 6,867,406
- Issue date Mar 15, 2005
- KLA-Tencor Corporation
- Christopher R. Fairley
- G01 - MEASURING TESTING
Information Patent Grant
Alignment correction prior to image sampling in inspection systems
- Patent number 6,141,038
- Issue date Oct 31, 2000
- KLA Instruments Corporation
- Scott A. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic photomask and reticle inspection method and apparatus inc...
- Patent number 4,805,123
- Issue date Feb 14, 1989
- KLA Instruments Corporation
- Donald F. Specht
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
3D STRUCTURE INSPECTION OR METROLOGY USING DEEP LEARNING
- Publication number 20220043357
- Publication date Feb 10, 2022
- KLA Corporation
- Scott A. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...
- Publication number 20190172675
- Publication date Jun 6, 2019
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEARNING BASED APPROACH FOR ALIGNING IMAGES ACQUIRED WITH DIFFERENT...
- Publication number 20180330511
- Publication date Nov 15, 2018
- KLA-Tencor Corporation
- Thanh Huy Ha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data Augmentation for Convolutional Neural Network-Based Defect Ins...
- Publication number 20180157933
- Publication date Jun 7, 2018
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHODS FOR COMBINED BRIGHTFIELD, DARKFIELD, AND PHOT...
- Publication number 20180003648
- Publication date Jan 4, 2018
- KLA-Tencor Corporation
- Lena Nicolaides
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATING SEMICONDUCTOR-RELATED COMPUTATIONS USING LEARNING BASE...
- Publication number 20170200260
- Publication date Jul 13, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYBRID INSPECTORS
- Publication number 20170194126
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...
- Publication number 20170193400
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...
- Publication number 20170084424
- Publication date Mar 23, 2017
- KLA-Tencor Corporation
- Doug K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHODS FOR COMBINED BRIGHTFIELD, DARKFIELD, AND PHOT...
- Publication number 20150226676
- Publication date Aug 13, 2015
- KLA-Tencor Corporation
- Lena Nicolaides
- G01 - MEASURING TESTING
Information Patent Application
Stereo Extended Depth of Focus
- Publication number 20130176402
- Publication date Jul 11, 2013
- KLA-Tencor Corporation
- Scott Young
- G02 - OPTICS
Information Patent Application
Solar Metrology Methods And Apparatus
- Publication number 20130048873
- Publication date Feb 28, 2013
- Scott Young
- G01 - MEASURING TESTING
Information Patent Application
Active Planar Autofocus
- Publication number 20120008137
- Publication date Jan 12, 2012
- KLA-Tencor Corporation
- Scott A. Young
- G01 - MEASURING TESTING
Information Patent Application
Dark Field Inspection System With Ring Illumination
- Publication number 20110169944
- Publication date Jul 14, 2011
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Application
Alignment correction prio to image sampling in inspection systems
- Publication number 20080304734
- Publication date Dec 11, 2008
- KLA INSTRUMENTS CORPORATION
- Scott A. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Confocal wafer inspection system and method
- Publication number 20080273196
- Publication date Nov 6, 2008
- KLA-Tencor Corporation
- Christopher R. Fairley
- G02 - OPTICS
Information Patent Application
Confocal wafer inspection method and apparatus using fly lens arran...
- Publication number 20070007429
- Publication date Jan 11, 2007
- KLA-Tencor Corporation
- Christopher R. Fairley
- G02 - OPTICS
Information Patent Application
Alignment correction prior to image sampling in inspection systems
- Publication number 20050254698
- Publication date Nov 17, 2005
- KLA INSTRUMENTS CORPORATION
- Scott A. Young
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Confocal wafer inspection method and apparatus
- Publication number 20050156098
- Publication date Jul 21, 2005
- Christopher R. Fairley
- G02 - OPTICS
Information Patent Application
Alignment correction prior to image sampling in inspection systems
- Publication number 20030063190
- Publication date Apr 3, 2003
- KLA INSTRUMENTS CORPORATION
- Scott A. Young
- G01 - MEASURING TESTING
Information Patent Application
Alignment correction prior to image sampling in inspection systems
- Publication number 20020075385
- Publication date Jun 20, 2002
- KLA INSTRUMENTS CORPORATION
- Scott A. Young
- G01 - MEASURING TESTING

Scott Young

Person

Patents Grantslast 30 patents

3D structure inspection or metrology using deep learning

Accelerated training of a machine learning based model for semicond...

Method and system for focus adjustment of a multi-beam scanning ele...

Learning based approach for aligning images acquired with different...

Apparatus and methods for combined brightfield, darkfield, and phot...

Data augmentation for convolutional neural network-based defect ins...

Accelerating semiconductor-related computations using learning base...

Method and system for focus adjustment of a multi-beam scanning ele...

Method and system for focus adjustment of a multi-beam scanning ele...

Stereo extended depth of focus

Hybrid inspectors

Apparatus and methods for combined brightfield, darkfield, and phot...

Combined semiconductor metrology system

Dark field inspection system with ring illumination

Inspection site preparation

Digital pathology system

Active planar autofocus

Solar metrology methods and apparatus

Method and system for hierarchical tissue analysis and classification

Confocal wafer inspection system and method

Confocal wafer inspection method and apparatus using fly lens arran...

Confocal wafer depth scanning inspection method

Reuse in semiconductor measurement recipes

Confocal wafer inspection method and apparatus using fly lens arran...

Alignment correction prior to image sampling in inspection systems

Automatic photomask and reticle inspection method and apparatus inc...

Patents Applicationslast 30 patents

3D STRUCTURE INSPECTION OR METROLOGY USING DEEP LEARNING

Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...

LEARNING BASED APPROACH FOR ALIGNING IMAGES ACQUIRED WITH DIFFERENT...

Data Augmentation for Convolutional Neural Network-Based Defect Ins...

APPARATUS AND METHODS FOR COMBINED BRIGHTFIELD, DARKFIELD, AND PHOT...

ACCELERATING SEMICONDUCTOR-RELATED COMPUTATIONS USING LEARNING BASE...

HYBRID INSPECTORS

ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...

Method and System for Focus Adjustment of a Multi-Beam Scanning Ele...

APPARATUS AND METHODS FOR COMBINED BRIGHTFIELD, DARKFIELD, AND PHOT...

Stereo Extended Depth of Focus

Solar Metrology Methods And Apparatus

Active Planar Autofocus

Dark Field Inspection System With Ring Illumination

Alignment correction prio to image sampling in inspection systems

Confocal wafer inspection system and method

Confocal wafer inspection method and apparatus using fly lens arran...

Alignment correction prior to image sampling in inspection systems

Confocal wafer inspection method and apparatus

Alignment correction prior to image sampling in inspection systems

Alignment correction prior to image sampling in inspection systems