Sead Zildzic

Person

Rancho Cordova, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Read level compensation for partially programmed blocks of memory d...
- Patent number 12,224,017
- Issue date Feb 11, 2025
- Micron Technology, Inc.
- Nagendra Prasad Ganesh Rao
- G11 - INFORMATION STORAGE
Information Patent Grant
Parallelized defect detection across multiple sub-blocks in a memor...
- Patent number 12,217,799
- Issue date Feb 4, 2025
- Micron Technology, Inc.
- Paing Z. Htet
- G11 - INFORMATION STORAGE
Information Patent Grant
Managing the programming of an open translation unit
- Patent number 12,217,794
- Issue date Feb 4, 2025
- Micron Technology, Inc.
- Murong Lang
- G11 - INFORMATION STORAGE
Information Patent Grant
Concurrent programming of retired wordline cells with dummy data
- Patent number 12,170,113
- Issue date Dec 17, 2024
- Micron Technology, Inc.
- Jeffrey S. McNeil
- G11 - INFORMATION STORAGE
Information Patent Grant
Two-tier defect scan management
- Patent number 12,105,967
- Issue date Oct 1, 2024
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Copyback clear command for performing a scan and read in a memory d...
- Patent number 12,105,961
- Issue date Oct 1, 2024
- Micron Technology, Inc.
- Jeffrey S. McNeil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Managing the programming of an open translation unit
- Patent number 11,923,001
- Issue date Mar 5, 2024
- Micron Technology, Inc.
- Murong Lang
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan optimization using data selection across wordline of a memory...
- Patent number 11,715,547
- Issue date Aug 1, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan optimization using data selection across wordline of a memory...
- Patent number 11,475,969
- Issue date Oct 18, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Grant
Read window size
- Patent number 11,231,982
- Issue date Jan 25, 2022
- Micron Technology, Inc.
- Jung Sheng Hoei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Read window size
- Patent number 10,936,392
- Issue date Mar 2, 2021
- Micron Technology, Inc.
- Jung Sheng Hoei
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COPYBACK CLEAR COMMAND FOR PERFORMING A SCAN AND READ IN A MEMORY D...
- Publication number 20250004645
- Publication date Jan 2, 2025
- Micron Technology, Inc.
- Jeffrey S. McNeil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TWO-TIER DEFECT SCAN MANAGEMENT
- Publication number 20240402922
- Publication date Dec 5, 2024
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANAGING THE PROGRAMMING OF AN OPEN TRANSLATION UNIT
- Publication number 20240170057
- Publication date May 23, 2024
- Micron Technology, Inc.
- Murong Lang
- G11 - INFORMATION STORAGE
Information Patent Application
READ LEVEL COMPENSATION FOR PARTIALLY PROGRAMMED BLOCKS OF MEMORY D...
- Publication number 20240087655
- Publication date Mar 14, 2024
- Micron Technology, Inc.
- Nagendra Prasad Ganesh Rao
- G11 - INFORMATION STORAGE
Information Patent Application
TWO-TIER DEFECT SCAN MANAGEMENT
- Publication number 20240069765
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICES WITH A LOWER EFFECTIVE PROGRAM VERIFY LEVEL
- Publication number 20240071484
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Massimo Ernesto Bertuccio
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH FAST WRITE MODE TO MITIGATE POWER LOSS
- Publication number 20240046990
- Publication date Feb 8, 2024
- Micron Technology, Inc.
- Yu-Chung LIEN
- G11 - INFORMATION STORAGE
Information Patent Application
UNDERFILL DETECTION FOR MEMORY SYSTEMS
- Publication number 20240020002
- Publication date Jan 18, 2024
- Micron Technology, Inc.
- Tomer Eliash
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARTIAL BLOCK READ LEVEL VOLTAGE COMPENSATION TO DECREASE READ TRIG...
- Publication number 20230368845
- Publication date Nov 16, 2023
- Micron Technology, Inc.
- Nagendra Prasad Ganesh Rao
- G11 - INFORMATION STORAGE
Information Patent Application
BOOST VOLTAGE MODULATED CORRECTIVE READ
- Publication number 20230352098
- Publication date Nov 2, 2023
- Micron Technology, Inc.
- Nagendra Prasad Ganesh Rao
- G11 - INFORMATION STORAGE
Information Patent Application
PRE-READ OPERATION FOR MULTI-PASS PROGRAMMING OF MEMORY DEVICES
- Publication number 20230307058
- Publication date Sep 28, 2023
- Micron Technology, Inc.
- Nagendra Prasad Ganesh Rao
- G11 - INFORMATION STORAGE
Information Patent Application
PARALLELIZED DEFECT DETECTION ACROSS MULTIPLE SUB-BLOCKS IN A MEMOR...
- Publication number 20230307053
- Publication date Sep 28, 2023
- Micron Technology, Inc.
- Paing Z. Htet
- G11 - INFORMATION STORAGE
Information Patent Application
CONCURRENT SCAN OPERATION ON MULTIPLE BLOCKS IN A MEMORY DEVICE
- Publication number 20230206992
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING THE PROGRAMMING OF AN OPEN TRANSLATION UNIT
- Publication number 20230206997
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Murong Lang
- G11 - INFORMATION STORAGE
Information Patent Application
CONCURRENT PROGRAMMING OF RETIRED WORDLINE CELLS WITH DUMMY DATA
- Publication number 20230197163
- Publication date Jun 22, 2023
- Micron Technology, Inc.
- Jeffrey S. McNeil
- G11 - INFORMATION STORAGE
Information Patent Application
COPYBACK CLEAR COMMAND FOR PERFORMING A SCAN AND READ IN A MEMORY D...
- Publication number 20230145358
- Publication date May 11, 2023
- Micron Technology, Inc.
- Jeffrey S. McNeil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN OPTIMIZATION USING DATA SELECTION ACROSS WORDLINE OF A MEMORY...
- Publication number 20230012644
- Publication date Jan 19, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Application
SCAN OPTIMIZATION USING DATA SELECTION ACROSS WORDLINE OF A MEMORY...
- Publication number 20220199184
- Publication date Jun 23, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Application
READ WINDOW SIZE
- Publication number 20210149755
- Publication date May 20, 2021
- Micron Technology, Inc.
- Jung Sheng Hoei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
READ WINDOW SIZE
- Publication number 20200210259
- Publication date Jul 2, 2020
- Micron Technology, Inc.
- Jung Sheng Hoei
- G06 - COMPUTING CALCULATING COUNTING

Sead Zildzic

Person

Patents Grantslast 30 patents

Read level compensation for partially programmed blocks of memory d...

Parallelized defect detection across multiple sub-blocks in a memor...

Managing the programming of an open translation unit

Concurrent programming of retired wordline cells with dummy data

Two-tier defect scan management

Copyback clear command for performing a scan and read in a memory d...

Managing the programming of an open translation unit

Scan optimization using data selection across wordline of a memory...

Scan optimization using data selection across wordline of a memory...

Read window size

Read window size

Patents Applicationslast 30 patents

COPYBACK CLEAR COMMAND FOR PERFORMING A SCAN AND READ IN A MEMORY D...

TWO-TIER DEFECT SCAN MANAGEMENT

MANAGING THE PROGRAMMING OF AN OPEN TRANSLATION UNIT

READ LEVEL COMPENSATION FOR PARTIALLY PROGRAMMED BLOCKS OF MEMORY D...

TWO-TIER DEFECT SCAN MANAGEMENT

MEMORY DEVICES WITH A LOWER EFFECTIVE PROGRAM VERIFY LEVEL

MEMORY DEVICE WITH FAST WRITE MODE TO MITIGATE POWER LOSS

UNDERFILL DETECTION FOR MEMORY SYSTEMS

PARTIAL BLOCK READ LEVEL VOLTAGE COMPENSATION TO DECREASE READ TRIG...

BOOST VOLTAGE MODULATED CORRECTIVE READ

PRE-READ OPERATION FOR MULTI-PASS PROGRAMMING OF MEMORY DEVICES

PARALLELIZED DEFECT DETECTION ACROSS MULTIPLE SUB-BLOCKS IN A MEMOR...

CONCURRENT SCAN OPERATION ON MULTIPLE BLOCKS IN A MEMORY DEVICE

MANAGING THE PROGRAMMING OF AN OPEN TRANSLATION UNIT

CONCURRENT PROGRAMMING OF RETIRED WORDLINE CELLS WITH DUMMY DATA

COPYBACK CLEAR COMMAND FOR PERFORMING A SCAN AND READ IN A MEMORY D...

SCAN OPTIMIZATION USING DATA SELECTION ACROSS WORDLINE OF A MEMORY...

SCAN OPTIMIZATION USING DATA SELECTION ACROSS WORDLINE OF A MEMORY...

READ WINDOW SIZE

READ WINDOW SIZE