Sean Hand

Person

Santa Barbara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
AFM imaging with metrology-preserving real time denoising
- Patent number 11,796,565
- Issue date Oct 24, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
AFM imaging with creep correction
- Patent number 11,714,104
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High speed atomic force profilometry of large areas
- Patent number 11,668,730
- Issue date Jun 6, 2023
- Bruker Nano, Inc.
- Jason Osborne
- G01 - MEASURING TESTING
Information Patent Grant
AFM imaging with real time drift correction
- Patent number 11,604,210
- Issue date Mar 14, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High speed atomic force profilometry of large areas
- Patent number 10,969,406
- Issue date Apr 6, 2021
- Bruker Nano, Inc.
- Jason Osborne
- G01 - MEASURING TESTING
Information Patent Grant
Precise probe placement in automated scanning probe microscopy systems
- Patent number 9,995,763
- Issue date Jun 12, 2018
- Bruker Nano, Inc.
- Jason Osborne
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of Analyzing Metrology Data
- Publication number 20230400781
- Publication date Dec 14, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
AFM Imaging with Real Time Drift Correction
- Publication number 20230009857
- Publication date Jan 12, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- B82 - NANO-TECHNOLOGY
Information Patent Application
AFM Imaging with Creep Correction
- Publication number 20220381803
- Publication date Dec 1, 2022
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Application
AFM Imaging with Metrology-Preserving Real Time Denoising
- Publication number 20220326277
- Publication date Oct 13, 2022
- Bruker Nano, Inc.
- Vladimir Fonoberov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
High Speed Atomic Force Profilometry of Large Areas
- Publication number 20210341513
- Publication date Nov 4, 2021
- Bruker Nano, Inc.
- Jason Osborne
- G01 - MEASURING TESTING
Information Patent Application
High Speed Atomic Force Profilometry of Large Areas
- Publication number 20200049734
- Publication date Feb 13, 2020
- Bruker Nano, Inc.
- Jason Osborne
- G01 - MEASURING TESTING
Information Patent Application
PRECISE PROBE PLACEMENT IN AUTOMATED SCANNING PROBE MICROSCOPY SYSTEMS
- Publication number 20150241469
- Publication date Aug 27, 2015
- Bruker Nano, Inc.
- Jason Osborne
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

AFM imaging with metrology-preserving real time denoising

AFM imaging with creep correction

High speed atomic force profilometry of large areas

AFM imaging with real time drift correction

High speed atomic force profilometry of large areas

Precise probe placement in automated scanning probe microscopy systems

Patents Applicationslast 30 patents

Method of Analyzing Metrology Data

AFM Imaging with Real Time Drift Correction

AFM Imaging with Creep Correction

AFM Imaging with Metrology-Preserving Real Time Denoising

High Speed Atomic Force Profilometry of Large Areas

High Speed Atomic Force Profilometry of Large Areas

PRECISE PROBE PLACEMENT IN AUTOMATED SCANNING PROBE MICROSCOPY SYSTEMS