Sean Liu

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Hertfordshire, GB

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for enhanced critical dimension scatterometry
- Patent number 7,502,101
- Issue date Mar 10, 2009
- Nanometrics Incorporated
- Chris Raymond
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060289788
- Publication date Dec 28, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for enhanced critical dimension scatterometry
- Publication number 20060289789
- Publication date Dec 28, 2006
- Accent Optical Technologies, Inc.
- Chris Raymond
- G01 - MEASURING TESTING