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Sean M. Collins
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Richardson, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Close proximity scanning surface contamination analyzer
Patent number
7,897,410
Issue date
Mar 1, 2011
Texas Instruments Incorporated
Sean M. Collins
G01 - MEASURING TESTING
Information
Patent Grant
Method for varying the uniformity of a dopant as it is placed in a...
Patent number
7,208,330
Issue date
Apr 24, 2007
Texas Instruments Incorporated
Sean M. Collins
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Close Proximity Scanning Surface Contamination Analyzer
Publication number
20090153856
Publication date
Jun 18, 2009
TEXAS INSTRUMENTS INCORPORATED
Sean M. Collins
G01 - MEASURING TESTING
Information
Patent Application
Purge process conducted in the presence of a purge plasma
Publication number
20060172545
Publication date
Aug 3, 2006
Texas Instruments, Inc.
Kenneth A. Hewes
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Method for varying the uniformity of a dopant as it is placed in a...
Publication number
20060154457
Publication date
Jul 13, 2006
Texas Instruments, Inc.
Sean M. Collins
H01 - BASIC ELECTRIC ELEMENTS