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SEAN P. LEARY
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SARABURI, TH
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Patents Grants
last 30 patents
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Patent Grant
Detecting thickness variation and quantitative depth utilizing scan...
Patent number
9,372,078
Issue date
Jun 21, 2016
Western Digital (Fremont), LLC
Kurt C. Ruthe
G01 - MEASURING TESTING
Information
Patent Grant
Methods for correcting for thermal drift in microscopy images
Patent number
8,989,511
Issue date
Mar 24, 2015
Western Digital Technologies, Inc.
Sean P. Leary
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods for referencing related magnetic head microscopy scans to r...
Patent number
8,490,211
Issue date
Jul 16, 2013
Western Digital Technologies, Inc.
Sean P. Leary
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Characterization with picosecond ultrasonics of metal portions of s...
Patent number
8,312,772
Issue date
Nov 20, 2012
Rudolph Technologies, Inc.
Guray Tas
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
DETECTING THICKNESS VARIATION AND QUANTITATIVE DEPTH UTILIZING SCAN...
Publication number
20160265908
Publication date
Sep 15, 2016
WESTERN DIGITAL (FREMONT), LLC
KURT C. RUTHE
G01 - MEASURING TESTING
Information
Patent Application
CHARACTERIZATION WITH PICOSECOND ULTRASONICS OF METAL PORTIONS OF S...
Publication number
20100281981
Publication date
Nov 11, 2010
Guray Tas
G01 - MEASURING TESTING