Sean PARK

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Yongin-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
System and method of inspecting device under test, and method of ma...
- Patent number 10,459,348
- Issue date Oct 29, 2019
- Samsung Electronics Co., Ltd.
- Myung-Ho Jung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging apparatus and imaging method
- Patent number 10,429,315
- Issue date Oct 1, 2019
- Samsung Electronics Co., Ltd.
- Akio Ishikawa
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF INSPECTING DEVICE UNDER TEST, AND METHOD OF MA...
- Publication number 20190137884
- Publication date May 9, 2019
- Samsung Electronics Co., Ltd.
- Myung-Ho JUNG
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS AND IMAGING METHOD
- Publication number 20190025226
- Publication date Jan 24, 2019
- Samsung Electronics Co., Ltd.
- Akio ISHIKAWA
- G06 - COMPUTING CALCULATING COUNTING