Sean T. Burns

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Menlo Park, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe tip assembly for testing optical components
- Patent number 11,885,830
- Issue date Jan 30, 2024
- Lumentum Operations LLC
- Sean Burns
- G01 - MEASURING TESTING
Information Patent Grant
Wafer prober to facilitate testing of a wafer using nanosecond pulses
- Patent number 11,181,572
- Issue date Nov 23, 2021
- Lumentum Operations LLC
- Yuanzhen Zhuang
- G01 - MEASURING TESTING
Information Patent Grant
Suspended substrate circuits and nuclear magnetic resonance probes...
- Patent number 8,587,314
- Issue date Nov 19, 2013
- Agilent Technologies, Inc.
- Sean T. Burns
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DRIVER CIRCUIT FOR AN ADDRESSABLE ARRAY OF OPTICAL EMITTERS
- Publication number 20220299604
- Publication date Sep 22, 2022
- Lumentum Operations LLC
- Mikhail DOLGANOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE TIP ASSEMBLY
- Publication number 20220229091
- Publication date Jul 21, 2022
- Lumentum Operations LLC
- Sean BURNS
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBER TO FACILITATE TESTING OF A WAFER USING NANOSECOND PULSES
- Publication number 20210325451
- Publication date Oct 21, 2021
- Lumentum Operations LLC
- Yuanzhen ZHUANG
- G01 - MEASURING TESTING
Information Patent Application
SUSPENDED SUBSTRATE CIRCUITS AND NUCLEAR MAGNETIC RESONANCE PROBES...
- Publication number 20120212224
- Publication date Aug 23, 2012
- AGILENT TECHNOLOGIES, INC.
- Sean T. Burns
- G01 - MEASURING TESTING