Sean Wheeler

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for detecting cracks in a wafer
- Patent number 9,255,894
- Issue date Feb 9, 2016
- KLA-Tencor Corporation
- William VanHoomissen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LIGHT SOURCE VARIABILITY CORRECTION IN ADDITIVE MANUFACTURING
- Publication number 20230330935
- Publication date Oct 19, 2023
- Carbon, Inc.
- Ariel M. Herrmann
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
ADDITIVE MANUFACTURING APPARATUS WITH PURGED LIGHT ENGINE
- Publication number 20220266514
- Publication date Aug 25, 2022
- Carbon, Inc.
- Anant Chimmalgi
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
RESIN CASSETTES
- Publication number 20210141313
- Publication date May 13, 2021
- Carbon, Inc.
- Jean-Claude de Sugny
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and Method for Detecting Cracks in a Wafer
- Publication number 20140152976
- Publication date Jun 5, 2014
- KLA-Tencor Corporation
- William VanHoomissen
- G01 - MEASURING TESTING