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Seang P. Malathong
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Newark, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
System for testing an integrated circuit of a device and its method...
Patent number
11,977,098
Issue date
May 7, 2024
AEHR Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
Pressure relief valve
Patent number
11,592,465
Issue date
Feb 28, 2023
AEHR Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
Pressure relief valve
Patent number
11,112,429
Issue date
Sep 7, 2021
AEHR Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
Limiting translation for consistent substrate-to-substrate contact
Patent number
10,401,385
Issue date
Sep 3, 2019
AEHR Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
Controlling alignment during a thermal cycle
Patent number
9,880,197
Issue date
Jan 30, 2018
AEHR Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
Controlling alignment during a thermal cycle
Patent number
9,625,521
Issue date
Apr 18, 2017
AEHR Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
System for testing an integrated circuit of a device and its method...
Patent number
8,947,116
Issue date
Feb 3, 2015
AEHR Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
System for testing an integrated circuit of a device and its method...
Patent number
8,030,957
Issue date
Oct 4, 2011
AEHR Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Grant
Reloading of die carriers without removal of die carriers from sock...
Patent number
7,303,929
Issue date
Dec 4, 2007
AEHR Test Systems
Martin A. Hemmerling
G01 - MEASURING TESTING
Information
Patent Grant
Die carrier
Patent number
7,126,363
Issue date
Oct 24, 2006
AEHR Test Systems
Seang P. Malathong
G01 - MEASURING TESTING
Information
Patent Grant
Die carrier
Patent number
6,859,057
Issue date
Feb 22, 2005
AEHR Test Systems
Seang P. Malathong
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CONTROLLING ALIGNMENT DURING A THERMAL CYCLE
Publication number
20240230714
Publication date
Jul 11, 2024
Aehr Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHO...
Publication number
20230168277
Publication date
Jun 1, 2023
AEHR TEST SYSTEMS
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Application
PRESSURE RELIEF VALVE
Publication number
20210364549
Publication date
Nov 25, 2021
Aehr Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Application
PRESSURE RELIEF VALVE
Publication number
20190339303
Publication date
Nov 7, 2019
Aehr Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Application
LIMITING TRANSLATION FOR CONSISTENT SUBSTRATE-TO-SUBSTRATE CONTACT
Publication number
20180113150
Publication date
Apr 26, 2018
Aehr Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Application
CONTROLLING ALIGNMENT DURING A THERMAL CYCLE
Publication number
20170176492
Publication date
Jun 22, 2017
Aehr Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Application
CONTROLLING ALIGNMENT DURING A THERMAL CYCLE
Publication number
20150109011
Publication date
Apr 23, 2015
Aehr Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
Publication number
20110316577
Publication date
Dec 29, 2011
Aehr Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
Publication number
20100244866
Publication date
Sep 30, 2010
Aehr Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Application
Reloading of die carriers without removal of die carriers from sock...
Publication number
20060057747
Publication date
Mar 16, 2006
Martin A. Hemmerling
G01 - MEASURING TESTING
Information
Patent Application
Die carrier
Publication number
20050136704
Publication date
Jun 23, 2005
Seang P. Malathong
G01 - MEASURING TESTING
Information
Patent Application
Die carrier
Publication number
20040051544
Publication date
Mar 18, 2004
Seang P. Malathong
G01 - MEASURING TESTING