Sebastian Bernrieder

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Regensburg, DE

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Patents Grantslast 30 patents

Information Patent Grant
System and method for examining semiconductor substrates
- Patent number 10,859,534
- Issue date Dec 8, 2020
- Infineon Technologies AG
- Oliver Nagler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR EXAMINING SEMICONDUCTOR SUBSTRATES
- Publication number 20190178848
- Publication date Jun 13, 2019
- INFINEON TECHNOLOGIES AG
- Oliver Nagler
- G01 - MEASURING TESTING
Information Patent Application
PROCESS SUPPORT SYSTEM AND METHOD
- Publication number 20150286975
- Publication date Oct 8, 2015
- INFINEON TECHNOLOGIES AG
- Thomas Berlehner
- G06 - COMPUTING CALCULATING COUNTING