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Sebastian BÖHM
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Bremen, DE
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Patents Grants
last 30 patents
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Patent Grant
Method of operating a secondary-electron multiplier in the ion dete...
Patent number
11,581,174
Issue date
Feb 14, 2023
Sebastian Böhm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of operating a secondary-electron multiplier in the ion dete...
Patent number
11,049,705
Issue date
Jun 29, 2021
Sebastian Böhm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wide-range high mass resolution in reflector time-of-flight mass sp...
Patent number
10,937,642
Issue date
Mar 2, 2021
Sebastian Böhm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Desorption beam control with virtual axis tracking in time-of-fligh...
Patent number
10,796,896
Issue date
Oct 6, 2020
Sebastian Böhm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wide-range high mass resolution in reflector time-of-flight mass sp...
Patent number
10,615,022
Issue date
Apr 7, 2020
Sebastian Böhm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time-of-flight mass spectrometer with spatial focusing of a broad m...
Patent number
9,773,657
Issue date
Sep 26, 2017
Sebastian Böhm
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Assessing the contamination in a mass-spectrometric MALDI ion source
Patent number
8,497,472
Issue date
Jul 30, 2013
Bruker Daltonik GmbH
Jens Höhndorf
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF OPERATING A SECONDARY-ELECTRON MULTIPLIER IN THE ION DETE...
Publication number
20210287891
Publication date
Sep 16, 2021
Bruker Daltonics GmbH & Co. KG
Sebastian BÖHM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...
Publication number
20200152439
Publication date
May 14, 2020
Bruker Daltonik GmbH
Sebastian BÖHM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DESORPTION BEAM CONTROL WITH VIRTUAL AXIS TRACKING IN TIME-OF-FLIGH...
Publication number
20190362958
Publication date
Nov 28, 2019
Bruker Daltonik GmbH
Sebastian BÖHM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF OPERATING A SECONDARY-ELECTRON MULTIPLIER IN THE ION DETE...
Publication number
20190304764
Publication date
Oct 3, 2019
Bruker Daltonik GmbH
Sebastian BÖHM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...
Publication number
20190096651
Publication date
Mar 28, 2019
Bruker Daltonik GmbH
Sebastian BÖHM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER WITH SPATIAL FOCUSING OF A BROAD M...
Publication number
20160111271
Publication date
Apr 21, 2016
Bruker Daltonik GmbH
Sebastian BÖHM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ASSESSING THE CONTAMINATION IN A MASS-SPECTROMETRIC MALDI ION SOURCE
Publication number
20120228489
Publication date
Sep 13, 2012
Jens Höhndorf
H01 - BASIC ELECTRIC ELEMENTS