Sebastian BÖHM

Person

Bremen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method of operating a secondary-electron multiplier in the ion dete...
- Patent number 11,581,174
- Issue date Feb 14, 2023
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of operating a secondary-electron multiplier in the ion dete...
- Patent number 11,049,705
- Issue date Jun 29, 2021
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide-range high mass resolution in reflector time-of-flight mass sp...
- Patent number 10,937,642
- Issue date Mar 2, 2021
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Desorption beam control with virtual axis tracking in time-of-fligh...
- Patent number 10,796,896
- Issue date Oct 6, 2020
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide-range high mass resolution in reflector time-of-flight mass sp...
- Patent number 10,615,022
- Issue date Apr 7, 2020
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer with spatial focusing of a broad m...
- Patent number 9,773,657
- Issue date Sep 26, 2017
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Assessing the contamination in a mass-spectrometric MALDI ion source
- Patent number 8,497,472
- Issue date Jul 30, 2013
- Bruker Daltonik GmbH
- Jens Höhndorf
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL
- Publication number 20240355610
- Publication date Oct 24, 2024
- Bruker Daltonics GmbH & Co. KG
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A SECONDARY-ELECTRON MULTIPLIER IN THE ION DETE...
- Publication number 20210287891
- Publication date Sep 16, 2021
- Bruker Daltonics GmbH & Co. KG
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...
- Publication number 20200152439
- Publication date May 14, 2020
- Bruker Daltonik GmbH
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESORPTION BEAM CONTROL WITH VIRTUAL AXIS TRACKING IN TIME-OF-FLIGH...
- Publication number 20190362958
- Publication date Nov 28, 2019
- Bruker Daltonik GmbH
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A SECONDARY-ELECTRON MULTIPLIER IN THE ION DETE...
- Publication number 20190304764
- Publication date Oct 3, 2019
- Bruker Daltonik GmbH
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...
- Publication number 20190096651
- Publication date Mar 28, 2019
- Bruker Daltonik GmbH
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER WITH SPATIAL FOCUSING OF A BROAD M...
- Publication number 20160111271
- Publication date Apr 21, 2016
- Bruker Daltonik GmbH
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ASSESSING THE CONTAMINATION IN A MASS-SPECTROMETRIC MALDI ION SOURCE
- Publication number 20120228489
- Publication date Sep 13, 2012
- Jens Höhndorf
- H01 - BASIC ELECTRIC ELEMENTS

Sebastian BÖHM

Person

Patents Grantslast 30 patents

Method of operating a secondary-electron multiplier in the ion dete...

Method of operating a secondary-electron multiplier in the ion dete...

Wide-range high mass resolution in reflector time-of-flight mass sp...

Desorption beam control with virtual axis tracking in time-of-fligh...

Wide-range high mass resolution in reflector time-of-flight mass sp...

Time-of-flight mass spectrometer with spatial focusing of a broad m...

Assessing the contamination in a mass-spectrometric MALDI ion source

Patents Applicationslast 30 patents

DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL

METHOD OF OPERATING A SECONDARY-ELECTRON MULTIPLIER IN THE ION DETE...

WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...

DESORPTION BEAM CONTROL WITH VIRTUAL AXIS TRACKING IN TIME-OF-FLIGH...

METHOD OF OPERATING A SECONDARY-ELECTRON MULTIPLIER IN THE ION DETE...

WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...

TIME-OF-FLIGHT MASS SPECTROMETER WITH SPATIAL FOCUSING OF A BROAD M...

ASSESSING THE CONTAMINATION IN A MASS-SPECTROMETRIC MALDI ION SOURCE