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Sebastian GIESSMANN
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Hsinchu County, TW
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Patents Grants
last 30 patents
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Patent Grant
Optical path correction subassembly, optical detection assembly, an...
Patent number
12,007,319
Issue date
Jun 11, 2024
MPI CORPORATION
Po-Yi Ting
G01 - MEASURING TESTING
Information
Patent Grant
Probe station capable of maintaining position of probe tip upon tem...
Patent number
11,313,883
Issue date
Apr 26, 2022
MPI CORPORATION
Yu-Hsun Hsu
G01 - MEASURING TESTING
Information
Patent Grant
Method of positioning probe tips relative to pads
Patent number
10,996,239
Issue date
May 4, 2021
MPI CORPORATION
Ingo Berg
G01 - MEASURING TESTING
Information
Patent Grant
Wafer probe station
Patent number
10,895,587
Issue date
Jan 19, 2021
MPI CORPORATION
Yu-Hsun Hsu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MOTORIZED CHUCK STAGE CONTROLLING METHOD
Publication number
20230314505
Publication date
Oct 5, 2023
MPI Corporation
Sebastian Giessmann
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
OPTICAL PATH CORRECTION SUBASSEMBLY, OPTICAL DETECTION ASSEMBLY, AN...
Publication number
20230147804
Publication date
May 11, 2023
MPI Corporation
PO-YI TING
G11 - INFORMATION STORAGE
Information
Patent Application
OPTICAL DETECTION SYSTEM AND ALIGNMENT METHOD FOR A PREDETERMINED T...
Publication number
20230058964
Publication date
Feb 23, 2023
MPI Corporation
SEBASTIAN GIESSMANN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PROBE SYSTEM AND MACHINE APPARATUS THEREOF
Publication number
20230059740
Publication date
Feb 23, 2023
MPI Corporation
STOJAN KANEV
G01 - MEASURING TESTING
Information
Patent Application
PROBE STATION
Publication number
20220074972
Publication date
Mar 10, 2022
MPI Corporation
Yu-Hsun HSU
G01 - MEASURING TESTING
Information
Patent Application
WAFER PROBE STATION
Publication number
20200209279
Publication date
Jul 2, 2020
MPI Corporation
Yu-Hsun HSU
G01 - MEASURING TESTING