Sebastian Giessmann

Person

Wildenhain, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for optically representing electronic semiconduct...
- Patent number 11,754,511
- Issue date Sep 12, 2023
- FormFactor, Inc.
- Jens Fiedler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor inspecting method for ensuring scrubbing length on pad
- Patent number 11,703,541
- Issue date Jul 18, 2023
- Volker Hansel
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspecting method
- Patent number 11,693,050
- Issue date Jul 4, 2023
- Volker Hansel
- G01 - MEASURING TESTING
Information Patent Grant
Prober for testing devices in a repeat structure on a substrate
- Patent number 9,983,232
- Issue date May 29, 2018
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Grant
Prober for testing devices in a repeat structure on a substrate
- Patent number 8,841,932
- Issue date Sep 23, 2014
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Grant
Prober for testing devices in a repeat structure on a substrate
- Patent number 7,932,737
- Issue date Apr 26, 2011
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Grant
Prober for testing magnetically sensitive components
- Patent number 7,741,860
- Issue date Jun 22, 2010
- SUSS MicroTec Test Systems GmbH
- Sebastian Giessmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for controlling the temperature of electronic...
- Patent number 7,671,615
- Issue date Mar 2, 2010
- SUSS MicroTec Tech Systems GmbH
- Carel van de Beek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INSPECTING METHOD FOR ENSURING SCRUBBING LENGTH ON PAD
- Publication number 20220155365
- Publication date May 19, 2022
- MPI CORPORATION
- Volker Hansel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTING METHOD
- Publication number 20220155366
- Publication date May 19, 2022
- MPI CORPORATION
- Volker Hansel
- G01 - MEASURING TESTING
Information Patent Application
Method and device for optically representing electronic semiconduct...
- Publication number 20190157326
- Publication date May 23, 2019
- FormFactor Beaverton, Inc.
- Jens Fiedler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE
- Publication number 20150008948
- Publication date Jan 8, 2015
- Cascade Microtech, Inc.
- Frank-Michael Werner
- G01 - MEASURING TESTING
Information Patent Application
PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE
- Publication number 20110316574
- Publication date Dec 29, 2011
- Frank-Michael WERNER
- G01 - MEASURING TESTING
Information Patent Application
PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE
- Publication number 20090179658
- Publication date Jul 16, 2009
- SUSS MicroTec Test Systems GmbH
- Frank-Michael WERNER
- G01 - MEASURING TESTING
Information Patent Application
PROBER FOR TESTING COMPONENTS
- Publication number 20090058442
- Publication date Mar 5, 2009
- SUSS MicroTec Test Systems GmbH
- Sebastian GIESSMANN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC...
- Publication number 20080042679
- Publication date Feb 21, 2008
- SUSS MicroTec Test Systems GmbH
- Carel van de Beek
- G01 - MEASURING TESTING

Sebastian Giessmann

Person

Patents Grantslast 30 patents

Method and device for optically representing electronic semiconduct...

Semiconductor inspecting method for ensuring scrubbing length on pad

Semiconductor inspecting method

Prober for testing devices in a repeat structure on a substrate

Prober for testing devices in a repeat structure on a substrate

Prober for testing devices in a repeat structure on a substrate

Prober for testing magnetically sensitive components

Method and apparatus for controlling the temperature of electronic...

Patents Applicationslast 30 patents

SEMICONDUCTOR INSPECTING METHOD FOR ENSURING SCRUBBING LENGTH ON PAD

SEMICONDUCTOR INSPECTING METHOD

Method and device for optically representing electronic semiconduct...

PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE

PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE

PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE

PROBER FOR TESTING COMPONENTS

METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC...